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High-Resolution Transmission Electron Microscopy
High-Resolution Transmission Electron Microscopy
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International Edition


About the Book

This book provides an introduction to the fundamental concepts, techniques, and methods used for electron microscopy at high resolution in space, energy, and even in time. It delineates the theory of elastic scattering, which is most useful for spectroscopic and chemical analyses. There are also discussions of the theory and practice of image calculations, and applications of HRTEM to the study of solid surfaces, highly disordered materials, solid state chemistry, mineralogy, semiconductors and metals. Contributors include J. Cowley, J. Spence, P. Buseck, P. Self, and M.A. O'Keefe. Compiled by experts in the fields of geology, physics and chemistry, this comprehensive text will be the standard reference for years to come.


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Product Details
  • ISBN-13: 9780195042757
  • Publisher: Oxford University Press, USA
  • Publisher Imprint: Oxford University Press, USA
  • Height: 236 mm
  • No of Pages: 670
  • Series Title: English
  • Weight: 1081 gr
  • ISBN-10: 0195042751
  • Publisher Date: 02 Feb 1989
  • Binding: Hardback
  • Language: English
  • Returnable: N
  • Spine Width: 48 mm
  • Width: 161 mm


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