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Alvin W. Strong

Alvin W. Strong

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1.

Reliability Wearout Mechanisms in Advanced CMOS Technologies

Reliability Wearout Mechanisms in Advanced CMOS Technologies

By: Timothy D. Sullivan, Alvin W. Strong, Ernest Y. Wu, Rolf-Peter Vollertsen, Jordi Sune

Publisher: John Wiley & Sons Inc

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₹9,620

Binding:	Hardback
Release:	04 Sep 2009
Language:	English

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2.

Reliability Wearout Mechanisms in Advanced CMOS chnologies

Reliability Wearout Mechanisms in Advanced CMOS chnologies

By: Timothy D. Sullivan, Alvin W. Strong, Ernest Y. Wu, Rolf-Peter Vollertsen, Jordi Sune

Publisher: John Wiley and Sons Ltd

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₹14,624

Binding:	Other digital
Release:	14 Oct 2009
Language:	English

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