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Bin (Professor, School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China) Gao

Bin (Professor, School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China) Gao

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Transient Electromagnetic-Thermal Nondestructive Testing

48 %

Transient Electromagnetic-Thermal Nondestructive Testing

By: Bin Gao, Yunze He, Ali Sophian, Ali (Assistant Professor, Mechatronics Engineering Department, Faculty of Engineering, International Islamic University Malaysia, Kuala Lumpur) Sophian, Bin (Professor, School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China) Gao

Publisher: Elsevier

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₹13,410

₹6,973

Binding:	Paperback
Release:	29 May 2017
Language:	English

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