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Chun K Loong

Chun K Loong

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Advanced Characterization of Nanostructured Materials: Probing the Structure and Dynamics with Synchrotron X-Rays and NeutronsPOD/NR
Advanced Characterization of Nanostructured Materials: Probing the Structure and Dynamics with Synchrotron X-Rays and Neutrons
By: Chun Keung Loong, Sunil K Sinha, Milan K Sanyal, Chun K Loong, Chun Keung (The Chinese Univ Of Hong Kong, Hong Kong) Loong
Publisher: World Scientific Publishing Company
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₹13,695
Binding:
Hardback
Release:
29 May 2021
Language:
English
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Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
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