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David E. Root

David E. RootDavid E. Root is Agilent Research Fellow and Measurement and Modeling Sciences Architect at Agilent Technologies, Inc., where he works on nonlinear device and behavioral modeling, large-signal simulation, and nonlinear measurements for new technical apabilities and business opportunities. He is a Fellow of the IEEE and in 2007 he received the 2007 IEEE ARFTG Technology Award. Read More Read Less

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1.
Nonlinear Circuit Simulation and Modeling38 %
Nonlinear Circuit Simulation and Modeling
By: David E. Root, Jianjun Xu, José Carlos Pedro, Luís Cótimos Nunes
Publisher: Cambridge University Press
No Review Yet
₹11,408
₹7,073
Binding:
Hardback
Release:
14 Jun 2018
Language:
English
Available
Ships within 4-6 Days Explain..
2.
The Natural History of Religion28 %
The Natural History of Religion
By: H. E. Root, David Hume
Publisher: Stanford University Press
No Review Yet
₹2,317
₹1,668
Binding:
Paperback
Release:
01 Jun 1957
Language:
English
Available
Ships within 12-14 Days Explain..
3.
Nonlinear Transistor Model Parameter Extraction Techniques
Nonlinear Transistor Model Parameter Extraction Techniques
By: Christian Fager, Matthias Rudolph, David E. Root
Publisher: Cambridge University Press
No Review Yet
₹6,661
Binding:
Hardback
Release:
13 Oct 2011
Language:
English
Available
Ships within 4-6 Days Explain..
4.
X-Parameters3 % POD/NR
X-Parameters
By: David E. Root, Jan Verspecht, Jason Horn, Mihai Marcu
Publisher: Cambridge University Press
No Review Yet
₹12,792
₹12,408
Binding:
Hardback
Release:
26 Sep 2013
Language:
English
International Edition
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Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
5.
Nonlinear Circuit Simulation and Modeling
Nonlinear Circuit Simulation and Modeling
By: David E. Root, Jianjun Xu, José Carlos Pedro, Luís Cótimos Nunes
Publisher: Cambridge University Press
No Review Yet
₹16,241
Binding:
Digital download and online
Release:
07 Jun 2018
Language:
English
Out of Stock
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6.
X-Parameters32 % NR
X-Parameters
By: David E. Root, Jan Verspecht, Jason Horn, Mihai Marcu
Publisher: Cambridge University Press
No Review Yet
₹15,480
₹10,458
Binding:
Digital download and online
Release:
05 Oct 2013
Language:
English
Out of Stock
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7.
Nonlinear Transistor Model Parameter Extraction Techniques32 % NR
Nonlinear Transistor Model Parameter Extraction Techniques
By: Christian Fager, Matthias Rudolph, David E. Root
Publisher: Cambridge University Press
No Review Yet
₹15,480
₹10,458
Binding:
Digital download and online
Release:
25 Oct 2011
Language:
English
Out of Stock
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