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David L. Griscom

David L. Griscom

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1.
Defects in Sio2 and Related Dielectrics: Science and Technology22 % POD/NR
Defects in Sio2 and Related Dielectrics: Science and Technology
By: Gianfranco Pacchioni, Linards Skuja, David L. Griscom, David L Griscom
Publisher: Springer
No Review Yet
₹25,588
₹19,959
Binding:
Hardback
Release:
31 Dec 2000
Language:
English
International Edition
Ships within 12-14 Days Explain..
Free Shipping in India and low cost Worldwide.
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
2.
Defects in Sio2 and Related Dielectrics: Science and TechnologyPOD/NR
Defects in Sio2 and Related Dielectrics: Science and Technology
By: Gianfranco Pacchioni, Linards Skuja, David L. Griscom, David L Griscom
Publisher: Springer
No Review Yet
₹19,908
Binding:
Paperback
Release:
31 Dec 2000
Language:
English
International Edition
Ships within 12-14 Days Explain..
Free Shipping in India and low cost Worldwide.
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
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