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Duparre

Duparre

9 results found
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1.
Optical Inspection of Microsystems47 %
Optical Inspection of Microsystems
By: Bing Zhao, Wolfgang Osten, Christophe Gorecki, Angela Duparre, Anand Asundi
Publisher: Taylor & Francis Ltd
No Review Yet
₹6,167
₹3,269
Binding:
Paperback
Release:
17 Oct 2019
Language:
English
Available
Ships within 14-16 Days Explain..
2.
Advanced Characterization Techniques For Optical Semiconductor and Data Storage Components
Advanced Characterization Techniques For Optical Semiconductor and Data Storage Components
By: Duparre
Publisher: Spie Press
No Review Yet
₹12,305
Binding:
Paperback
Release:
01 Jan 2002
Language:
English
Out of Stock
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3.
Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries II
Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries II
By: Angela Duparre, Bhanwar Singh
Publisher: Spie Press
No Review Yet
₹10,597
Binding:
Paperback
Release:
01 Jan 2001
Language:
English
Out of Stock
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4.
Optical Inspection of Microsystems
Optical Inspection of Microsystems
By: Bing Zhao, Wolfgang Osten, Christophe Gorecki, Angela Duparre, Anand Asundi
Publisher: Taylor & Francis Ltd
No Review Yet
₹4,536
Binding:
Digital (delivered electronically)
Release:
03 Oct 2018
Language:
English
Out of Stock
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5.
Optical Inspection of Microsystems
Optical Inspection of Microsystems
By: Bing Zhao, Wolfgang Osten, Christophe Gorecki, Angela Duparre, Anand Asundi
Publisher: Taylor & Francis Ltd
No Review Yet
₹4,536
Binding:
Digital (delivered electronically)
Release:
03 Oct 2018
Language:
English
Out of Stock
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6.
Optical Inspection of Microsystems
Optical Inspection of Microsystems
By: Bing Zhao, Wolfgang Osten, Christophe Gorecki, Angela Duparre, Anand Asundi
Publisher: Taylor & Francis Inc
No Review Yet
₹11,815
Binding:
Digital (delivered electronically)
Release:
03 Oct 2018
Language:
English
Out of Stock
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7.
Advanced Characterization Techniques for Optics, Semiconductors and Nanotechnologies (Proceedings of SPIE)NR
Advanced Characterization Techniques for Optics, Semiconductors and Nanotechnologies (Proceedings of SPIE)
By: Duparre
Publisher: Spie Press
No Review Yet
₹10,848
Binding:
Paperback
Release:
29 Dec 2003
Language:
English
Out of Stock
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8.
Optical Fabrication, Testing, and Metrology IV2 % NR
Optical Fabrication, Testing, and Metrology IV
By: Angela Duparre
Publisher: Spie Press
No Review Yet
₹9,318
₹9,132
Binding:
Paperback
Release:
15 Nov 2011
Language:
English
Out of Stock
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9.
Optical Inspection of Microsystems12 % NR
Optical Inspection of Microsystems
By: Bing Zhao, Wolfgang Osten, Christophe Gorecki, Angela Duparre, Anand Asundi
Publisher: Taylor & Francis Inc
No Review Yet
₹14,415
₹12,667
Binding:
Hardback
Release:
20 Jul 2006
Language:
English
Out of Stock
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