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Eddy Simoen

Eddy SimoenEddy Simoen is a Senior Researcher at IMEC, where he is currently involved in research on the defect and strain engineering in high-mobility and epitaxial substrates and defect studies in germanium and III-V compounds.

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1.
CMOS Past, Present and Future42 %
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₹19,600
₹11,368
Binding:
Paperback
Release:
04 May 2018
Language:
English
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2.
Metal Impurities in Silicon- and Germanium-Based Technologies37 %
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₹19,379
₹12,209
Binding:
Hardback
Release:
22 Aug 2018
Language:
English
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3.
Extended Defects in Germanium37 %
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₹17,099
₹10,772
Binding:
Paperback
Release:
30 Nov 2010
Language:
English
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4.
Metal Impurities in Silicon- and Germanium-Based Technologies37 %
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₹19,379
₹12,209
Binding:
Paperback
Release:
30 Jan 2019
Language:
English
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5.
Extended Defects in Germanium
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₹7,905
Binding:
Hardback
Release:
18 Feb 2009
Language:
English
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7.
Random Telegraph Signals in Semiconductor Devices5 % NR
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₹3,288
₹3,124
Binding:
Paperback
Release:
01 Nov 2016
Language:
English
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8.
Radiation Effects in Advanced Semiconductor Materials and Devices
Publisher: Springer
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₹2,201
Binding:
Paperback
Release:
15 Jan 2014
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9.
Germanium-Based Technologies
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₹15,396
Binding:
Digital (delivered electronically)
Release:
14 May 2014
Language:
English
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10.
Extended Defects in Germanium
Publisher: Springer
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₹0
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Digital (delivered electronically)
Release:
01 Jan 2009
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11.
Germanium-Based Technologies
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₹0
Binding:
Digital (delivered electronically)
Release:
07 May 2007
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12.
Random Telegraph Signals in Semiconductor Devices
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₹10,177
Binding:
Digital download
Release:
01 Nov 2016
Language:
English
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13.
Random Telegraph Signals in Semiconductor Devices
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₹10,177
Binding:
Digital download
Release:
11 Jan 2016
Language:
English
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14.
Extended Defects in Germanium: Fundamental and Technological Aspects
Publisher: Springer
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₹20,419
Binding:
Undefined
Release:
01 Jan 2009
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15.
Germanium-Based Technologies: From Materials to Devices
Publisher: Elsevier Science
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₹20,503
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Release:
01 Jan 2011
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16.
Germanium-Based Technologies38 % NR
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₹18,480
₹11,458
Binding:
Hardback
Release:
23 Mar 2007
Language:
English
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