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Eishi Ibe

Eishi Ibe

5 results found
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1.
Terrestrial Radiation Effects in ULSI Devices and Electronic Systems
Terrestrial Radiation Effects in ULSI Devices and Electronic Systems
By: Eishi H. Ibe
Publisher: John Wiley & Sons Inc
No Review Yet
₹5,474
Binding:
Hardback
Release:
13 Feb 2015
Language:
English
Available
Ships within 4-6 Days Explain..
2.
Terrestrial Neutron-induced Soft Error In Advanced Memory Devices
Terrestrial Neutron-induced Soft Error In Advanced Memory Devices
By: Mamoru Baba, Eishi Ibe, Hideaki Kameyama, Yasuo Yahagi, Takashi Nakamura
Publisher: World Scientific Publishing Co Pte Ltd
No Review Yet
₹6,204
Binding:
Hardback
Release:
03 Apr 2008
Language:
English
Available
Ships within 10-12 Days Explain..
3.
Dependability in Electronic Systems37 %
Dependability in Electronic Systems
By: Nobuyasu Kanekawa, Eishi H. Ibe, Takashi Suga, Yutaka Uematsu
Publisher: Springer-Verlag New York Inc.
No Review Yet
₹10,949
₹6,898
Binding:
Hardback
Release:
24 Nov 2010
Language:
English
Available
Ships within 14-16 Days Explain..
4.
Dependability in Electronic Systems37 %
Dependability in Electronic Systems
By: Nobuyasu Kanekawa, Eishi H. Ibe, Takashi Suga, Yutaka Uematsu
Publisher: Springer-Verlag New York Inc.
No Review Yet
₹12,280
₹7,736
Binding:
Paperback
Release:
09 Oct 2014
Language:
English
Available
Ships within 14-16 Days Explain..
5.
Dependability in Electronic Systems
Dependability in Electronic Systems
By: Nobuyasu Kanekawa, Takashi Suga, Eishi H Ibe
Publisher: Springer
No Review Yet
₹2,201
Binding:
Paperback
Release:
10 Nov 2010
Language:
English
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