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H. Rusty Harris

H. Rusty Harris

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1.
CMOS Gate-Stack Scaling — Materials, Interfaces and Reliability Implications: Volume 11555 % POD/NR
CMOS Gate-Stack Scaling — Materials, Interfaces and Reliability Implications: Volume 1155
By: H. Rusty Harris, Alexander A. Demkov, Jeffery W. Butterbaugh, Bill Taylor, Willy Rachmady
Publisher: Cambridge University Press
No Review Yet
₹3,335
₹3,168
Binding:
Paperback
Release:
05 Jun 2014
Language:
English
International Edition
Ships within 14-16 Days Explain..
Free Shipping in India and low cost Worldwide.
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
2.
CMOS Gate-Stack Scaling — Materials, Interfaces and Reliability Implications: Volume 1155POD/NR
CMOS Gate-Stack Scaling — Materials, Interfaces and Reliability Implications: Volume 1155
By: H. Rusty Harris, Alexander A. Demkov, Jeffery W. Butterbaugh, Bill Taylor, Willy Rachmady
Publisher: Materials Research Society
No Review Yet
₹11,008
Binding:
Hardback
Release:
19 Nov 2009
Language:
English
International Edition
Ships within 14-16 Days Explain..
Free Shipping in India and low cost Worldwide.
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
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