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I. Cev Noyan

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1.

Advances in X-Ray Analysis

36 %

Advances in X-Ray Analysis

By: John V. Gilfrich, Ting C. Huang, Ron Jenkins, I. Cev Noyan, C.C. Goldsmith

Publisher: Springer-Verlag New York Inc.

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₹5,474

₹3,503

Binding:	Paperback
Release:	05 Nov 2012
Language:	English

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Ships within 14-16 Days Explain..

2.

Advances in x-Ray Analysis

59 %

Advances in x-Ray Analysis

By: C.C. Goldsmith, I. Cev Noyan (IBM Research Center, Yorktown Heights, NY, USA), John V. Gilfrich (Sachs/Freeman Associates/NRL, Washington, DC, USA), Ron Jenkins (International Centre for Diffraction Data, Newton Square, Pennsylvania, USA), Ting C. Huang (IBM Almaden Research Center, San Jose, CA, USA)

Publisher: Kluwer Academic Publishers Group

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₹10,402

₹4,265

Binding:	Hardback
Release:	30 Sep 1994
Language:	English

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