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J. Antonio Quiroga

J. Antonio Quiroga

6 results found
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1.
Fringe Pattern Analysis for Optical Metrology
Fringe Pattern Analysis for Optical Metrology
By: Manuel Servin, J. Antonio Quiroga, Moises Padilla
Publisher: John Wiley and Sons Ltd
No Review Yet
₹0
Binding:
Digital (delivered electronically)
Release:
30 May 2014
Language:
English
Out of Stock
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2.
Fringe Pattern Analysis for Optical Metrology
Fringe Pattern Analysis for Optical Metrology
By: Manuel Servin, J. Antonio Quiroga, Moises Padilla
Publisher: John Wiley and Sons Ltd
No Review Yet
₹0
Binding:
Digital (delivered electronically)
Release:
30 May 2014
Language:
English
Out of Stock
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3.
Fringe Pattern Analysis for Optical Metrology – Theory, Algorithms, and Applications
Fringe Pattern Analysis for Optical Metrology – Theory, Algorithms, and Applications
By: Manuel Servin, J. Antonio Quiroga, Moises Padilla
Publisher: Wiley-VCH Verlag GmbH
No Review Yet
₹15,257
Binding:
Other digital
Release:
24 Jun 2014
Language:
English
Out of Stock
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4.
Fringe Pattern Analysis for Optical Metrology
Fringe Pattern Analysis for Optical Metrology
By: Manuel Servin, J. Antonio Quiroga, Moises Padilla
Publisher: John Wiley and Sons Ltd
No Review Yet
₹0
Binding:
Digital (delivered electronically)
Release:
27 May 2014
Language:
English
Out of Stock
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5.
Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications
Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications
By: Manuel Servin, Moises Padilla, J Antonio Quiroga
Publisher: Wiley-vch
No Review Yet
₹0
Binding:
Digital (delivered electronically)
Release:
01 Jan 2014
Out of Stock
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6.
Fringe Pattern Analysis for Optical Metrology30 % NR
Fringe Pattern Analysis for Optical Metrology
By: Manuel Servin, J. Antonio Quiroga, Moises Padilla
Publisher: Wiley-VCH Verlag GmbH
No Review Yet
₹15,167
₹10,617
Binding:
Hardback
Release:
02 Jul 2014
Language:
English
Out of Stock
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