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J. Antonio Quiroga

J. Antonio Quiroga

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1.

Fringe Pattern Analysis for Optical Metrology

Fringe Pattern Analysis for Optical Metrology

By: Manuel Servin, J. Antonio Quiroga, Moises Padilla

Publisher: Wiley-VCH Verlag GmbH

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₹10,711

Binding:	Hardback
Release:	02 Jul 2014
Language:	English

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2.

Fringe Pattern Analysis for Optical Metrology – Theory, Algorithms, and Applications

Fringe Pattern Analysis for Optical Metrology – Theory, Algorithms, and Applications

By: Manuel Servin, J. Antonio Quiroga, Moises Padilla

Publisher: Wiley-VCH Verlag GmbH

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₹15,257

Binding:	Other digital
Release:	24 Jun 2014
Language:	English

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