Humburger Icon
Logo1
Login & Sign up
Bookswagon-24x7 online bookstore
AddBanner
Home icon Home
Account Icon Account
Wishlist Icon Wishlist
Cart Icon Cart
Bookswagon icon Categories
Close

Refine your Search

By Price

Availability

Shipping Time

Source

Binding

Language

Publication Year

Filter By Category
John V Bielecki

John V Bielecki

3 results found
List viewGrid view
Sort By:
1.
Estimating Engineering and Manufacturing Development Cost Risk Using Logistic and Multiple Regression17 % NR
Estimating Engineering and Manufacturing Development Cost Risk Using Logistic and Multiple Regression
By: John V Bielecki
Publisher: Hutson Street Press
No Review Yet
₹1,598
₹1,326
Binding:
Paperback
Release:
22 May 2025
Language:
English
International Edition
Ships within 12-14 Days Explain..
Free Shipping in India and low cost Worldwide.
2.
Estimating Engineering and Manufacturing Development Cost Risk Using Logistic and Multiple Regression16 % NR
Estimating Engineering and Manufacturing Development Cost Risk Using Logistic and Multiple Regression
By: John V Bielecki
Publisher: Hutson Street Press
No Review Yet
₹2,886
₹2,424
Binding:
Hardback
Release:
22 May 2025
Language:
English
International Edition
Ships within 12-14 Days Explain..
Free Shipping in India and low cost Worldwide.
3.
Estimating Engineering and Manufacturing Development Cost Risk Using Logistic and Multiple Regression18 % POD/NR
Estimating Engineering and Manufacturing Development Cost Risk Using Logistic and Multiple Regression
By: John V Bielecki
Publisher: Biblioscholar
No Review Yet
₹5,537
₹4,540
Binding:
Paperback
Release:
12 Nov 2012
Language:
English
International Edition
Ships within 12-14 Days Explain..
Free Shipping in India and low cost Worldwide.
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
No more records found
ASK VIDYA