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Manoj Sachdev

Manoj Sachdev

22 results found
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1.
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies7 % POD/NR
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
By: Andrei Pavlov, Manoj Sachdev
Publisher: Springer-Verlag New York Inc.
No Review Yet
₹18,239
₹16,962
Binding:
Hardback
Release:
21 Jun 2008
Language:
English
International Edition
Ships within 10-12 Days Explain..
Free Shipping in India and low cost Worldwide.
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
2.
Thermal and Power Management of Integrated Circuits35 %
Thermal and Power Management of Integrated Circuits
By: Arman Vassighi, Manoj Sachdev
Publisher: Springer-Verlag New York Inc.
No Review Yet
₹11,399
₹7,409
Binding:
Paperback
Release:
29 Nov 2010
Language:
English
Available
Ships within 14-16 Days Explain..
3.
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies35 %
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
By: Andrei Pavlov, Manoj Sachdev
Publisher: Springer
No Review Yet
₹18,239
₹11,855
Binding:
Paperback
Release:
28 Oct 2010
Language:
English
Available
Ships within 14-16 Days Explain..
4.
ESD Protection Device and Circuit Design for Advanced CMOS Technologies35 %
ESD Protection Device and Circuit Design for Advanced CMOS Technologies
By: Manoj Sachdev, Oleg Semenov, Hossein Sarbishaei
Publisher: Springer
No Review Yet
₹19,379
₹12,596
Binding:
Paperback
Release:
19 Oct 2010
Language:
English
Available
Ships within 14-16 Days Explain..
5.
ESD Protection Device and Circuit Design for Advanced CMOS Technologies35 %
ESD Protection Device and Circuit Design for Advanced CMOS Technologies
By: Manoj Sachdev, Oleg Semenov, Hossein Sarbishaei
Publisher: Springer-Verlag New York Inc.
No Review Yet
₹19,379
₹12,596
Binding:
Hardback
Release:
05 Jun 2008
Language:
English
Available
Ships within 14-16 Days Explain..
6.
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits35 %
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
By: Manoj Sachdev, José Pineda de Gyvez
Publisher: Springer-Verlag New York Inc.
No Review Yet
₹22,799
₹14,819
Binding:
Paperback
Release:
11 Oct 2010
Language:
English
Available
Ships within 14-16 Days Explain..
7.
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits14 % POD/NR
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
By: Manoj Sachdev, José Pineda de Gyvez
No Review Yet
₹26,299
₹22,617
Binding:
Hardback
Release:
01 Jan 1900
Language:
English
International Edition
Ships within 18-20 Days Explain..
Free Shipping in India and low cost Worldwide.
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
8.
Thermal and Power Management of Integrated CircuitsPOD/NR
Thermal and Power Management of Integrated Circuits
By: Arman Vassighi, Manoj Sachdev
Publisher: Springer-Verlag New York Inc.
No Review Yet
₹11,515
Binding:
Hardback
Release:
01 Apr 2006
Language:
English
International Edition
Ships within 14-16 Days Explain..
Free Shipping in India and low cost Worldwide.
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
9.
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
By: Manoj Sachdev, Jos Pineda De Gyvez
Publisher: Springer
No Review Yet
₹0
Binding:
Paperback
Release:
25 Aug 2008
Language:
English
Out of Stock
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10.
Esd Protection Device and Circuit Design for Advanced Cmos Technologies
Esd Protection Device and Circuit Design for Advanced Cmos Technologies
By: Manoj Sachdev, Oleg Semenov, Hossein Sarbishaei
Publisher: Springer-Verlag New York Inc.
No Review Yet
₹12,758
Binding:
Digital (delivered electronically)
Release:
01 Jan 2008
Language:
English
Out of Stock
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11.
Defect Oriented Testing for CMOS Analog and Digital Circuits
Defect Oriented Testing for CMOS Analog and Digital Circuits
By: Manoj Sachdev
Publisher: Springer
No Review Yet
₹2,201
Binding:
Paperback
Release:
15 Jan 2014
Out of Stock
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12.
Defect-Oriented Testing for Nano-Metric Cmos Vlsi Circuits
Defect-Oriented Testing for Nano-Metric Cmos Vlsi Circuits
By: Manoj Sachdev, Jose Pineda de Gyvez
Publisher: Springer-Verlag New York Inc.
No Review Yet
₹0
Binding:
Digital (delivered electronically)
Release:
/12/2007
Out of Stock
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13.
Esd Protection Device and Circuit Design for Advanced CMOS Technologies
Esd Protection Device and Circuit Design for Advanced CMOS Technologies
By: Manoj Sachdev, Oleg Semenov, Hossein Sarbishaei
Publisher: Springer
No Review Yet
₹15,312
Binding:
Graphic Novel
Release:
01 Jan 2008
Out of Stock
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14.
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
By: Manoj Sachdev
Publisher: Springer Us
No Review Yet
₹17,865
Binding:
Undefined
Release:
01 Jan 2007
Out of Stock
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15.
CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies
CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies
By: Andrei Pavlov, Manoj Sachdev
Publisher: Springer
No Review Yet
₹2,201
Binding:
Paperback
Release:
17 Jul 2008
Language:
English
Out of Stock
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16.
Defect Oriented Testing for CMOS Analog and Digital Circuits
Defect Oriented Testing for CMOS Analog and Digital Circuits
By: Vishwani D. Agrawal, Manoj Sachdev
Publisher: Kluwer Academic Publishers
No Review Yet
₹13,953
Binding:
Hardback
Release:
31 Dec 1997
Language:
English
Out of Stock
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17.
Cmos Sram Circuit Design and Parametric Test in Nano-Scaled Technologies
Cmos Sram Circuit Design and Parametric Test in Nano-Scaled Technologies
By: Andrei Pavlov, Manoj Sachdev
Publisher: Springer-Verlag New York Inc.
No Review Yet
₹0
Binding:
Digital (delivered electronically)
Release:
14 May 2014
Language:
English
Out of Stock
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18.
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits. Frontiers in Electronic Testing, Volume 34.
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits. Frontiers in Electronic Testing, Volume 34.
By: Jos Pineda De Gyvez, Manoj Sachdev
Publisher: Springer
No Review Yet
₹0
Binding:
Digital (delivered electronically)
Release:
01 Jan 2007
Out of Stock
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19.
Thermal and Power Management of Integrated Circuits
Thermal and Power Management of Integrated Circuits
By: Arman Vassighi, Manoj Sachdev
Publisher: Springer
No Review Yet
₹0
Binding:
Digital (delivered electronically)
Release:
01 Jan 2006
Out of Stock
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20.
Thermal and Power Management of Integrated Circuits
Thermal and Power Management of Integrated Circuits
By: Arman Vassighi, Manoj Sachdev
Publisher: Springer-Verlag New York Inc.
No Review Yet
₹10,204
Binding:
Digital (delivered electronically)
Release:
01 Jan 2006
Language:
English
Out of Stock
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