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Manoj Sachdev

Manoj Sachdev

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2.
Thermal and Power Management of Integrated Circuits37 %
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₹11,149
₹7,024
Binding:
Paperback
Release:
29 Nov 2010
Language:
English
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3.
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies37 %
Publisher: Springer
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₹17,839
₹11,239
Binding:
Paperback
Release:
28 Oct 2010
Language:
English
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4.
ESD Protection Device and Circuit Design for Advanced CMOS Technologies37 %
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₹18,954
₹11,941
Binding:
Hardback
Release:
06 May 2008
Language:
English
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5.
ESD Protection Device and Circuit Design for Advanced CMOS Technologies37 %
Publisher: Springer
No Review Yet
₹18,954
₹11,941
Binding:
Paperback
Release:
19 Oct 2010
Language:
English
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6.
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits37 %
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₹22,299
₹14,048
Binding:
Paperback
Release:
10 Nov 2010
Language:
English
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7.
Thermal and Power Management of Integrated Circuits59 %
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₹14,494
₹5,943
Binding:
Hardback
Release:
04 Jan 2006
Language:
English
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9.
Esd Protection Device and Circuit Design for Advanced CMOS Technologies
Publisher: Springer
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₹15,312
Binding:
Graphic Novel
Release:
01 Jan 2008
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10.
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Publisher: Springer Us
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₹17,865
Binding:
Undefined
Release:
01 Jan 2007
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11.
Esd Protection Device and Circuit Design for Advanced Cmos Technologies
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₹12,758
Binding:
Digital (delivered electronically)
Release:
01 Jan 2008
Language:
English
Out of Stock
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12.
Defect Oriented Testing for CMOS Analog and Digital Circuits
Publisher: Springer
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₹2,201
Binding:
Paperback
Release:
15 Jan 2014
Out of Stock
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13.
Defect Oriented Testing for CMOS Analog and Digital Circuits
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₹13,953
Binding:
Hardback
Release:
31 Dec 1997
Language:
English
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14.
Thermal and Power Management of Integrated Circuits
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₹10,204
Binding:
Digital (delivered electronically)
Release:
01 Jan 2006
Language:
English
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15.
CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies
Publisher: Springer
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₹2,201
Binding:
Paperback
Release:
17 Jul 2008
Language:
English
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16.
CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware Sram Design and Test
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17.
Thermal and Power Management of Integrated Circuits
Publisher: Springer Us
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₹15,312
Binding:
Undefined
Release:
01 Jan 2006
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