close menu
Bookswagon-24x7 online bookstore
close menu
My Account
Manoj Sachdev

Manoj Sachdev

17 results found
List viewGrid view
Sort By:
2.
Thermal and Power Management of Integrated Circuits37 %
No Review Yet
₹10,999
₹6,929
Binding:
Paperback
Release:
29 Nov 2010
Language:
English
Available
Ships within 14-16 Days Explain..
3.
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies37 %
Publisher: Springer
No Review Yet
₹17,599
₹11,087
Binding:
Paperback
Release:
28 Oct 2010
Language:
English
Available
Ships within 14-16 Days Explain..
4.
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits37 %
No Review Yet
₹21,999
₹13,859
Binding:
Paperback
Release:
10 Nov 2010
Language:
English
Available
Ships within 14-16 Days Explain..
5.
ESD Protection Device and Circuit Design for Advanced CMOS Technologies37 %
Publisher: Springer
No Review Yet
₹18,699
₹11,780
Binding:
Paperback
Release:
19 Oct 2010
Language:
English
Available
Ships within 14-16 Days Explain..
6.
ESD Protection Device and Circuit Design for Advanced CMOS Technologies37 %
No Review Yet
₹18,699
₹11,780
Binding:
Hardback
Release:
06 May 2008
Language:
English
Available
Ships within 14-16 Days Explain..
7.
Thermal and Power Management of Integrated Circuits59 %
No Review Yet
₹14,299
₹5,863
Binding:
Hardback
Release:
04 Jan 2006
Language:
English
Available
Ships within 2-4 Days Explain..
9.
Esd Protection Device and Circuit Design for Advanced CMOS Technologies
Publisher: Springer
No Review Yet
₹15,312
Binding:
Graphic Novel
Release:
01 Jan 2008
Out of Stock
Notify me when this book is in stockNotify Me
10.
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Publisher: Springer Us
No Review Yet
₹17,865
Binding:
Undefined
Release:
01 Jan 2007
Out of Stock
Notify me when this book is in stockNotify Me
11.
Esd Protection Device and Circuit Design for Advanced Cmos Technologies
No Review Yet
₹12,758
Binding:
Digital (delivered electronically)
Release:
01 Jan 2008
Language:
English
Out of Stock
Notify me when this book is in stockNotify Me
12.
Defect Oriented Testing for CMOS Analog and Digital Circuits
Publisher: Springer
No Review Yet
₹2,201
Binding:
Paperback
Release:
15 Jan 2014
Out of Stock
Notify me when this book is in stockNotify Me
13.
CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware Sram Design and Test
Out of Stock
Notify me when this book is in stockNotify Me
14.
Thermal and Power Management of Integrated Circuits
Publisher: Springer Us
No Review Yet
₹15,312
Binding:
Undefined
Release:
01 Jan 2006
Out of Stock
Notify me when this book is in stockNotify Me
15.
Defect Oriented Testing for CMOS Analog and Digital Circuits
No Review Yet
₹13,953
Binding:
Hardback
Release:
31 Dec 1997
Language:
English
Out of Stock
Notify me when this book is in stockNotify Me
16.
CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies
Publisher: Springer
No Review Yet
₹2,201
Binding:
Paperback
Release:
17 Jul 2008
Language:
English
Out of Stock
Notify me when this book is in stockNotify Me
17.
Thermal and Power Management of Integrated Circuits
No Review Yet
₹10,204
Binding:
Digital (delivered electronically)
Release:
01 Jan 2006
Language:
English
Out of Stock
Notify me when this book is in stockNotify Me
No more records found
ASK VIDYA