Martin Hÿtch

Martin HÿtchDr Martin Hÿtch, serial editor for the book series “Advances in Imaging and Electron Physics (AIEP)”, is a senior scientist at the French National Centre for Research (CNRS) in Toulouse. He moved to France after receiving his PhD from the University f Cambridge in 1991 on “Quantitative high-resolution transmission electron microscopy (HRTEM)”, joining the CNRS in Paris as permanent staff member in 1995. His research focuses on the development of quantitative electron microscopy techniques for materials science applications. He is notably the inventor of Geometric Phase Analysis (GPA) and Dark-Field Electron Holography (DFEH), two techniques for the measurement of strain at the nanoscale. Since moving to the CEMES-CNRS in Toulouse in 2004, he has been working on aberration-corrected HRTEM and electron holography for the study of electronic devices, nanocrystals and ferroelectrics. He was laureate of the prestigious European Microscopy Award for Physical Sciences of the European Microscopy Society in 2008. To date he has published 130 papers in international journals, filed 6 patents and has given over 70 invited talks at international conferences and workshops. Read More Read Less

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Advances in Imaging and Electron Physics45 %
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Advances in Optics of Charged Particle Analyzers: Part 245 %
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Advances in Imaging and Electron Physics45 %
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Advances in Optics of Charged Particle Analyzers: Part 145 %
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Nanolithography and Surface Microscopy with Electron Beams45 %
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Coulomb Interactions in Particle Beams45 %
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Advances in Imaging and Electron Physics45 %
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Advances in Imaging and Electron Physics45 %
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Aberration Theory in Electron and Ion Optics45 %
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The Properties of Ponderomotive Lenses45 %
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Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources45 %
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Quadrupoles in Electron Lens Design45 %
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Advances in Imaging and Electron Physics45 %
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Plasmon Coupling Physics45 %
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The Beginnings of Electron Microscopy - Part 245 %
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29 Apr 2022
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Quantitative Atomic-Resolution Electron Microscopy45 %
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Advances in Imaging and Electron Physics45 %
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Advances in Imaging and Electron Physics45 %
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The Beginnings of Electron Microscopy - Part 145 %
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Advances in Imaging and Electron Physics45 %
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