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N Keith Tovey

N Keith Tovey

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1.
Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks48 %
Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks
By: Sam Boggs Jr, Kenneth Pye, N. Keith (University of East Anglia) Tovey, David H Krinsley, N Keith Tovey
Publisher: Cambridge University Press
No Review Yet
₹11,378
₹5,917
Binding:
Hardback
Release:
13 Jul 1998
Language:
English
Available
Ships within 1-2 Days Explain..
2.
Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks25 % POD/NR
Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks
By: Sam Boggs Jr, Kenneth Pye, N. Keith (University of East Anglia) Tovey, David H Krinsley, N Keith Tovey
Publisher: Cambridge University Press
No Review Yet
₹4,956
₹3,717
Binding:
Paperback
Release:
15 Sep 2005
Language:
English
International Edition
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Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
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