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Nathan James Speer

Nathan James Speer

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Measuring the Electronic Structure of Atomically Uniform Silver Films Grown on Silicon Using Angle-Resolved Photoemission Spectroscopy

Measuring the Electronic Structure of Atomically Uniform Silver Films Grown on Silicon Using Angle-Resolved Photoemission Spectroscopy

By: Nathan James Speer

Publisher: Proquest, Umi Dissertation Publishing

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₹6,347

Binding:	Paperback
Release:	01 Sep 2011
Language:	English

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