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Patrick Echlin

Patrick Echlin

14 results found
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1.
Scanning Electron Microscopy and X-Ray Microanalysis37 %
Scanning Electron Microscopy and X-Ray Microanalysis
By: Dale E. Newbury, Charles E. Lyman, Linda Sawyer, Joseph Goldstein, Patrick Echlin
Publisher: Springer-Verlag New York Inc.
4.7 (6)
₹11,677
₹7,357
Binding:
Paperback
Release:
31 May 2013
Language:
English
Available
Ships within 12-14 Days Explain..
2.
Scanning Electron Microscopy and X-Ray Microanalysis37 %
Scanning Electron Microscopy and X-Ray Microanalysis
By: Dale E. Newbury, Charles E. Lyman, Linda Sawyer, Joseph Goldstein, Patrick Echlin
Publisher: Springer Science+Business Media
No Review Yet
₹11,677
₹7,357
Binding:
Hardback
Release:
31 Jan 2003
Language:
English
Available
Ships within 12-14 Days Explain..
3.
Low-Temperature Microscopy and Analysis37 %
Low-Temperature Microscopy and Analysis
By: Patrick Echlin
Publisher: Springer-Verlag New York Inc.
No Review Yet
₹21,231
₹13,376
Binding:
Paperback
Release:
18 Jun 2013
Language:
English
Available
Ships within 12-14 Days Explain..
4.
Low-Temperature Microscopy and Analysis37 %
Low-Temperature Microscopy and Analysis
By: Patrick Echlin
Publisher: Springer Science+Business Media
No Review Yet
₹21,231
₹13,376
Binding:
Hardback
Release:
31 Mar 1992
Language:
English
Available
Ships within 12-14 Days Explain..
5.
Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis37 %
Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
By: Patrick Echlin
Publisher: Springer-Verlag New York Inc.
No Review Yet
₹15,923
₹10,031
Binding:
Paperback
Release:
23 Nov 2010
Language:
English
Available
Ships within 12-14 Days Explain..
6.
Advanced Scanning Electron Microscopy and X-Ray Microanalysis21 %
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
By: Dale E. Newbury, Joseph Goldstein, Patrick Echlin, David C. Joy, C.E. Fiori
Publisher: Springer-Verlag New York Inc.
No Review Yet
₹10,615
₹8,386
Binding:
Paperback
Release:
08 Jun 2013
Language:
English
Available
Ships within 12-14 Days Explain..
7.
Advanced Scanning Electron Microscopy and X-Ray Microanalysis54 %
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
By: Dale E. Newbury, Joseph Goldstein, Patrick Echlin, David C. Joy, C.E. Fiori
Publisher: Springer Science+Business Media
No Review Yet
₹9,019
₹4,149
Binding:
Hardback
Release:
31 Mar 1986
Language:
English
Available
Ships within 2-4 Days Explain..
8.
Scanning Electron Microscopy and X-Ray Microanalysis37 %
Scanning Electron Microscopy and X-Ray Microanalysis
By: Dale E. Newbury, Charles Fiori, Joseph Goldstein, Patrick Echlin, David C. Joy
Publisher: Springer-Verlag New York Inc.
No Review Yet
₹10,615
₹6,687
Binding:
Paperback
Release:
20 Mar 2013
Language:
English
Available
Ships within 12-14 Days Explain..
9.
Scanning Electron Microscopy and X-Ray MicroanalysisNR
Scanning Electron Microscopy and X-Ray Microanalysis
By: Echlin Patrick Echlin, Goldstein Joseph Goldstein, Newbury Dale E. Newbury
Publisher: Springer Nature B.V.
No Review Yet
₹4,890
Binding:
Paperback
Release:
02 Jun 2013
Language:
English
International Edition
Ships within 12-14 Days Explain..
Free Shipping in India and low cost Worldwide.
10.
Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis18 % POD/NR
Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
By: Patrick Echlin
Publisher: Springer-Verlag New York Inc.
No Review Yet
₹15,846
₹12,994
Binding:
Hardback
Release:
19 Mar 2009
Language:
English
International Edition
Ships within 12-14 Days Explain..
Free Shipping in India and low cost Worldwide.
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
11.
Low-Temperature Microscopy and Analysis
Low-Temperature Microscopy and Analysis
By: Patrick Echlin
Publisher: Springer
No Review Yet
₹2,201
Binding:
Paperback
Release:
15 Jan 2014
Out of Stock
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12.
Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
By: Patrick Echlin
Publisher: Springer-Verlag New York Inc.
No Review Yet
₹8,502
Binding:
Digital (delivered electronically)
Release:
01 Jan 2009
Language:
English
Out of Stock
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13.
Scanning Electron Microscopy and X-Ray Microanalysis
Scanning Electron Microscopy and X-Ray Microanalysis
By: Dale E. Newbury, Charles Fiori, Patrick Echlin, David C. Joy, Eric Lifshin
Publisher: Kluwer Academic Publishers Group
No Review Yet
₹7,729
Binding:
Hardback
Release:
30 Nov 1981
Language:
English
Out of Stock
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14.
Scanning Electron Microscopy and X-ray Microanalysis
Scanning Electron Microscopy and X-ray Microanalysis
By: Dale E. Newbury, Joseph I. Goldstein, D. C. Joy, Patrick Echlin
Publisher: Kluwer Academic Publishers Group
No Review Yet
₹7,729
Binding:
Hardback
Release:
/06/1992
Language:
English
Out of Stock
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