Petr KlapetekPetr Klapetek is Head, Department of Nanometrology at the Czech Metrology Institute, Czech Republic. His research focuses on the metrology scanning probe microscope (SPM) construction, a key standard for nanometrology.He also participates in the Gwydion project, focused on the creation of multiplatform open-source software for scanning probe microscopy (SPM) data analysis. Read More Read Less