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Petr Klapetek

Petr KlapetekPetr Klapetek is Head, Department of Nanometrology at the Czech Metrology Institute, Czech Republic. His research focuses on the metrology scanning probe microscope (SPM) construction, a key standard for nanometrology.He also participates in the Gwydion project, focused on the creation of multiplatform open-source software for scanning probe microscopy (SPM) data analysis. Read More Read Less

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1.
Quantitative Data Processing in Scanning Probe Microscopy45 %
Quantitative Data Processing in Scanning Probe Microscopy
By: Petr Klapetek
Publisher: Elsevier Science Publishing Co Inc
No Review Yet
₹20,900
₹11,495
Binding:
Paperback
Release:
24 Jan 2018
Language:
English
Available
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2.
Quantitative Data Processing in Scanning Probe Microscopy13 % POD/NR
Quantitative Data Processing in Scanning Probe Microscopy
By: Petr Klapetek
Publisher: William Andrew Publishing
No Review Yet
₹13,110
₹11,436
Binding:
Hardback
Release:
19 Nov 2012
Language:
English
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