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Rajpal S. Sirohi

Rajpal S. Sirohi

14 results found
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1.
Introduction to Optical Metrology
Introduction to Optical Metrology
By: Rajpal S. Sirohi
Publisher: Taylor & Francis Ltd
No Review Yet
₹9,384
Binding:
Hardback
Release:
25 Sep 2025
Language:
English
Available
Ships within 8-10 Days Explain..
2.
Optical Components, Techniques, and Systems in Engineering3 % POD/NR
Optical Components, Techniques, and Systems in Engineering
By: Rajpal S. Sirohi, Mahendra P. Kothiyal
Publisher: Taylor & Francis Inc
No Review Yet
₹34,875
₹33,829
Binding:
Hardback
Release:
18 Dec 1990
Language:
English
International Edition
Ships within 14-16 Days Explain..
Free Shipping in India and low cost Worldwide.
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
3.
Introduction to Optical Metrology
Introduction to Optical Metrology
By: Rajpal S. Sirohi
Publisher: Taylor & Francis Ltd
No Review Yet
₹13,901
Binding:
Digital (delivered electronically)
Release:
26 Sep 2025
Language:
English
Out of Stock
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4.
Introduction to Optical Metrology
Introduction to Optical Metrology
By: Rajpal S. Sirohi
Publisher: Taylor & Francis Ltd
No Review Yet
₹13,901
Binding:
Digital (delivered electronically)
Release:
26 Sep 2025
Language:
English
Out of Stock
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5.
Selected Papers on Electric Speckle Pattern Interferometry
Selected Papers on Electric Speckle Pattern Interferometry
By: Rajpal S. Sirohi, Peter Meinlschmidt, Klaus D. Hinsch
Publisher: Spie Press
No Review Yet
₹9,645
Binding:
Hardback
Release:
31 Dec 1996
Language:
English
Out of Stock
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6.
Introduction to Optical Metrology
Introduction to Optical Metrology
By: Rajpal S. Sirohi
Publisher: Taylor & Francis Ltd
No Review Yet
₹15,496
Binding:
Digital (delivered electronically)
Release:
12 Jul 2017
Language:
English
Out of Stock
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7.
Selected Papers on Electronic Speckle Pattern Interferometry46 %
Selected Papers on Electronic Speckle Pattern Interferometry
By: Rajpal S. Sirohi, Peter Meinlschmidt, Klaus D. Hinsch
Publisher: Spie Press
No Review Yet
₹14,125
₹7,628
Binding:
Paperback
Release:
30 Dec 1996
Language:
English
Out of Stock
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8.
Introduction to Optical Metrology27 %
Introduction to Optical Metrology
By: Rajpal S. Sirohi
Publisher: Taylor & Francis Inc
No Review Yet
₹1,495
₹1,091
Binding:
Hardback
Release:
20 Aug 2015
Language:
English
Out of Stock
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9.
Selected Papers on Speckle MetrologyNR
Selected Papers on Speckle Metrology
By: Rajpal S. Sirohi, Sirohi, Sirohi
Publisher: Spie Press
No Review Yet
₹40,144
Binding:
Paperback
Release:
15 Jun 2006
Language:
English
Out of Stock
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