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Sandeep K. Goel (Editor)

Sandeep K. Goel (Editor)

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Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits5 % NR
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
By: Sandeep K. Goel, Chakrabarty Krishnendu, Krishnendu Chakrabarty , Sandeep K. Goel (Editor), Krishnendu Chakrabarty (Editor)
Publisher: CRC Press
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₹9,680
₹9,196
Binding:
Paperback
Release:
31 Mar 2017
Language:
English
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