Humburger Icon
Logo1
Login & Sign up
Bookswagon-24x7 online bookstore
AddBanner
Home icon Home
Account Icon Account
Wishlist Icon Wishlist
Cart Icon Cart
Bookswagon icon Categories
Close

Refine your Search

By Price

Availability

Shipping Time

Source

Binding

Language

Publication Year

Filter By Category
Sandeep K. Goel (Editor)

Sandeep K. Goel (Editor)

1 results found
List viewGrid view
Sort By:
1.
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits43 %
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
By: Sandeep K. Goel, Chakrabarty Krishnendu, Krishnendu Chakrabarty , Sandeep K. Goel (Editor), Krishnendu Chakrabarty (Editor)
Publisher: CRC Press
No Review Yet
₹8,024
₹4,574
Binding:
Paperback
Release:
31 Mar 2017
Language:
English
Available
Ships within 12-14 Days Explain..
No more records found