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1.
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XINR
Publisher: Spie Press
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₹6,277
Binding:
Paperback
Release:
01 Jan 2012
Language:
English
Out of Stock
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2.
Integrated OpticsNR
Publisher: Spie Press
No Review Yet
₹13,734
Binding:
Paperback
Release:
30 May 2018
Language:
English
Out of Stock
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3.
Integrated OpticsNR
Publisher: Spie Press
No Review Yet
₹12,098
Binding:
Paperback
Release:
30 Sep 2017
Language:
English
Out of Stock
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