W Murray Bullis

W Murray Bullis

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1.
Measurement Methods for the Semiconductor Device Industry: A Summary of Nbs Activity; December 1969 (Classic Reprint)
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2.
Characterization and Metrology for ULSI Technology38 %
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3.
Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report; October 1 to December 30, 1971 (Classic Reprint)NR
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4.
Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report; October 1 to December 30, 1971 (Classic Reprint)NR
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5.
Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report, July 1 to September 30, 1972 (Classic Reprint)NR
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6.
Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report, January 1 to March 30, 1972 (Classic Reprint)NR
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7.
Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report, January 1 to March 30, 1972 (Classic Reprint)NR
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8.
Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report, July 1 to September 30, 1972 (Classic Reprint)NR
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9.
Measurement Methods for the Semiconductor Device Industry: A Summary of Nbs Activity; December 1969 (Classic Reprint)NR
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10.
Semiconductor Characterization: Present Status and Future Need1 % NR
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₹7,438
₹7,400
Binding:
Hardback
Release:
08 Nov 2018
Language:
English
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11.
Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report July 1 to September 30, 1970 (Classic Reprint)NR
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12.
Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report July 1 to September 30, 1970 (Classic Reprint)NR
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13.
Measurement of Carrier Lifetime in Semiconductors: An Annotated Bibliography Covering the Period 1949-1967 (Classic Reprint)NR
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14.
Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report; April 1 to June 30, 1969 (Classic Reprint)NR
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15.
Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report, July 1 to September 30, 1971 (Classic Reprint)NR
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16.
Methods of Measurement for Semiconductor Materials, Process Control, and Divices: Quarterly Report, January 1 to March 31, 1970 (Classic Reprint)NR
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17.
Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report; January 1 to March 31, 1971 (Classic Reprint)NR
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18.
Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report, October 1 to December 31, 1968 (Classic Reprint)NR
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19.
Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report, October 1 to December 31, 1968 (Classic Reprint)NR
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20.
Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report; April 1 to June 30, 1969 (Classic Reprint)NR
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