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Weronika Walkosz

Weronika Walkosz

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1.
Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces37 %
Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces
By: Weronika Walkosz
Publisher: Springer-Verlag New York Inc.
No Review Yet
₹10,949
₹6,898
Binding:
Paperback
Release:
28 May 2013
Language:
English
Available
Ships within 22-24 Days Explain..
2.
Atomic Scale Characterization and First-Principles Studies of Si₃N₄ InterfacesPOD/NR
Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces
By: Weronika Walkosz
Publisher: Springer-Verlag New York Inc.
No Review Yet
₹10,456
Binding:
Hardback
Release:
19 Apr 2011
Language:
English
International Edition
Ships within 16-18 Days Explain..
Free Shipping in India and low cost Worldwide.
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
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