This book covers a broad range of topics in classical optics in the form of thirty seven self-contained chapters. The chapters in the first half of the book deal primarily with the basic concepts of optics, while those in the second half describe how these concepts can be used in a variety of technological applications. Each chapter introduces and develops a specialised topic in a comprehensive, clear and pedagogical style. The mathematical content is kept to a minimum as the book aims to provide the reader with accessible discussions of optical phenomena, aided by the numerous diagrams and computer simulation images. Topics covered include classical diffraction theory, optics of crystals, peculiarities of polarized light, thin-film multilayer stacks and coatings, geometrical optics and ray-tracing, optical microscopy, interferometry, coherence, holography, and nonlinear optics. As such, this book will constitute the supplementary-reading companion for graduate-level courses in optics, and for industrial scientists and engineers.

Table of Contents:
Preface; Introduction; 1. Abbe's sine condition; 2. Fourier optics; 3. Effects of polarization on diffraction in systems of high numerical aperture; 4. Gaussian beam optics; 5. Coherent and incoherent imaging; 6. First-order temporal coherence in classical optics; 7. The Van Cittert–Zernike theorem; 8. Partial polarization, Stokes parameters, and the Poincarè sphere; 9. What in the world are surface plasmons?; 10. The Faraday effect; 11. The magneto-optical Kerr effect; 12. Fabry–Perot etalons in polarized light; 13. The Ewald–Oseen extinction theorem; 14. Reciprocity in classical linear optics; 15. Optical vortices; 16. Geometric-optical rays, Poynting's vector, and field momenta; 17. Diffraction gratings; 18. The Talbot effect; 19. Some quirks of total internal reflection; 20. Evanescent coupling; 21. Internal and external conical refraction; 22. The method of Fox and Li; 23. The beam propagation method; 24. Michelson's stellar interferometer; 25. Bracewell's interferometric telescope; 26. Scanning optical microscopy; 27. Zernike's method of phase contrast; 28. Polarization microscopy; 29. Nomarski's differential interference contrast microscope; 30. The Van Leeuwenhoek microscope; 31. Projection photolithography; 32. The Ronchi test; 33. The Shack–Hartmann wavefront sensor; 34. Ellipsometry; 35. Holography and holographic interferometry; 36. Self-focusing in non-linear optical media; 37. Laser-induced heating of multilayers.