Engineering Metrology and Measurements is a textbook designed for students of mechanical, production and allied disciplines to facilitate learning of various shop-floor measurement techniques and also understand the basics of mechanical measurements. With a conventional introduction to the principles and standards of measurement, the book in subsequent chapters takes the reader through the important topics of metrology such as limits, fits and tolerances, linear measurements, angular measurements, comparators, optical measurements. The last few chapters discuss the measurement concepts of simple physical parameters such as force, torque, strain, temperature, and pressure, before introducing the contemporary information on nanometrology as the last chapter. Adopting an illustrative approach to explain the concepts, the book presents solved numerical problems, practice problems, review questions, and multiple choice questions.

Table of Contents:
1. : BASIC PRINCIPLES OF ENGINEERING METROLOGY ; 1.1 INTRODUCTION ; 1.2 METROLOGY DEFINED ; 1.3 NEED FOR INSPECTION ; 1.4 ACCURACY AND PRECISION ; 1.4.1 ACCURACY AND COST ; 1.5 OBJECTIVES OF METROLOGY AND MEASUREMENTS ; 1.6 GENERAL MEASUREMENT CONCEPTS ; 1.6.1 CALIBRATION OF MEASURING INSTRUMENTS ; 1.7 ERROR IN MEASUREMENTS ; 1.7.1 SYSTEMATIC AND CONTROLLABLE ERRORS ; 1.7.2 RANDOM ERRORS ; 1.8 METHODS OF MEASUREMENT ; 2. : STANDARDS OF MEASUREMENT ; 2.1 INTRODUCTION ; 2.2 STANDARDS AND THEIR ROLES ; 2.3 EVOLUTION OF STANDARDS ; 2.4 THE NATIONAL PHYSICAL LABORATORY (NPL) ; 2.5 MATERIAL STANDARD ; 2.5.1 YARD ; 2.5.2 METRE ; 2.5.3. DISADVANTAGES OF MATERIAL STANDARD ; 2.6 WAVELENGTH STANDARD ; 2.6.1 THE MODERN METRE ; 2.7 SUBDIVISIONS OF STANDARDS ; 2.8 LINE AND END MEASUREMENT ; 2.8.1 CHARACTERISTICS OF LINE STANDARDS ; 2.8.2 CHARACTERISTICS OF END STANDARDS ; 2.8.3 TRANSFER FROM LINE STANDARD TO END STANDARD ; 2.9 BROOKES LEVEL COMPARATOR ; 2.10 DISPLACEMENT METHOD ; 2.11 CALIBRATION OF END BARS ; 3. : LIMITS, FITS, AND TOLERANCES ; 3.1 INTRODUCTION ; 3.2 PRINCIPLE OF INTERCHANGEABILITY ; 3.2.1 SELECTIVE ASSEMBLY APPROACH ; 3.3 TOLERANCES ; 3.3.1 COMPUTER AIDED MODELLING ; 3.3.2 MANUFACTURING COST AND WORK TOLERANCE ; 3.3.3 CLASSIFICATION OF TOLERANCES ; 3.4 MAXIMUM AND MINIMUM METAL CONDITIONS ; 3.5 FITS ; 3.5.1 ALLOWANCE ; 3.5.2 HOLE BASIS AND SHAFT BASIS SYSTEM ; 3.6 SYSTEMS OF LIMITS AND FITS ; 3.6.1 GENERAL TERMINOLOGIES ; 3.6.2 LIMIT GAUGING ; 3.6.3 CLASSIFICATION OF GAUGES ; 3.6.4 TAYLOR'S PRINCIPLE ; 3.6.5 IMPORTANT GUIDELINES FOR GAUGE DESIGN ; 3.6.6 MATERIAL FOR GAUGES ; 3.6.7 GAUGE TOLERANCE ; 3.6.8 WEAR ALLOWANCE ; 3.6.9 METHODS OF TOLERANCE SPECIFICATION ON GAUGES ; 3.7 PLAIN PLUG GAUGES ; 3.8 SNAP GAUGES ; 4. : LINEAR MEASUREMENTS ; 4.1 INTRODUCTION ; 4.2 DESIGN OF LINEAR MEASUREMENT INSTRUMENTS ; 4.3 SURFACE PLATE ; 4.4 V BLOCKS ; 4.5 GRADUATED SCALES ; 4.6 SCALED INSTRUMENTS ; 4.6.1 DEPTH GAUGE ; 4.6.2 COMBINATION SET ; 4.6.3 CALIPERS ; 4.7 VERNIER INSTRUMENTS ; 4.7.1 VERNIER CALIPERS ; 4.7.2 VERNIER DEPTH GAUGE ; 4.7.3 VERNIER HEIGHT GAUGE ; 4.8 MICROMETER INSTRUMENTS ; 4.8.1 OUTSIDE MICROMETER ; 4.8.2 VERNIER MICROMETER ; 4.8.3 DIGITAL MICROMETER ; 4.8.4 INSIDE MICROMETER CALIPER ; 4.8.5 INSIDE MICROMETER ; 4.8.6 DEPTH MICROMETER ; 4.8.7 FLOATING CARRIAGE MICROMETER ; 4.9 SLIP GAUGES ; 4.9.1 GAUGE BLOCK SHAPES, GRADES AND SIZES ; 4.9.2 WRINGING OF SLIP GAUGES ; 4.9.3 MANUFACTURE OF SLIP GAUGES ; 4.9.4 CALIBRATION OF SLIP GAUGES ; 5. : ANGULAR MEASUREMENT ; 5.1 INTRODUCTION ; 5.2 PROTRACTOR ; 5.2.1 UNIVERSAL BEVEL PROTRACTOR ; 5.2.2 OPTICAL BEVEL PROTRACTOR ; 5.3 SINE BAR ; 5.3.1 SINE BLOCKS, SINE PLATES, AND SINE TABLES ; 5.3.2 SINE CENTRE ; 5.4 ANGLE GAUGES ; 5.4.1 USES OF ANGLE GAUGES ; 5.4.2 MANUFACTURE AND CALIBRATION OF ANGLE GAUGES ; 5.4.3 TRUE SQUARE ; 5.5 SPIRIT LEVEL ; 5.5.1 CLINOMETER ; 5.6 OPTICAL INSTRUMENTS FOR ANGULAR MEASUREMENT ; 5.6.1 AUTOCOLLIMATOR ; 5.6.2 AUTOCOLLIMATOR APPLICATIONS ; 5.6.3 ANGLE DEKKOR ; 6. : COMPARATORS ; 6.1 INTRODUCTION ; 6.2 FUNCTIONAL REQUIREMENTS ; 6.3 CLASSIFICATION OF COMPARATORS ; 6.4 MECHANICAL COMPARATORS ; 6.4.1 DIAL INDICATORS ; 6.4.2 JOHANSSON MICROKATOR ; 6.4.3 SIGMA COMPARATOR ; 6.5 MECHANICAL OPTICAL COMPARATOR ; 6.5.1 ZEISS ULTRA OPTIMETER ; 6.5.2 OPTICAL PROJECTOR ; 6.6 ELECTRICAL AND ELECTRONIC COMPARATORS ; 6.6.1 LVDT ; 6.6.2 ELECTRONIC COMPARATOR ; 6.7 PNEUMATIC COMPARATOR ; 6.7.1 FREE FLOW AIR GAUGE ; 6.7.2 BACK PRESSURE GAUGE ; 6.7.3 SOLEX PNEUMATIC GAUGE ; 6.7.4 APPLICATIONS OF PNEUMATIC COMPARATORS ; 7. : OPTICAL MEASUREMENTS AND INTERFEROMETRY ; 7.1 INTRODUCTION ; 7.2 OPTICAL MEASUREMENT TECHNIQUES ; 7.2.1 TOOL MAKER'S MICROSCOPE ; 7.2.2 PROFILE PROJECTOR ; 7.2.3 OPTICAL SQUARES ; 7.3 OPTICAL INTERFERENCE ; 7.4 INTERFEROMETRY ; 7.4.1 OPTICAL FLATS ; 7.5 INTERFEROMETERS ; 7.5.1 THE NPL FLATNESS INTERFEROMETER ; 7.5.2 PITTER-NPL GAUGE INTERFEROMETER ; 7.5.3 LASER INTERFEROMETERS ; 7.6 SCALES, GRATING, AND RETICLES ; 7.6.1 SCALES ; 7.6.2 GRATINGS ; 7.6.3 RETICLES ; 8. : METROLOGY OF GEARS AND SCREW THREADS ; 8.1 INTRODUCTION ; 8.2 GEAR TERMINOLOGY ; 8.3 ERROR IN SPUR GEARS ; 8.4 MEASUREMENT OF GEAR ELEMENTS ; 8.5 COMPOSITE METHOD OF GEAR INSPECTION ; 8.5.1 PARKINSON GEAR TESTER ; 8.6 MEASUREMENT OF SCREW THREADS ; 8.7 SCREW THREAD TERMINOLOGY ; 8.8 MEASUREMENT OF SCREW THREAD ELEMENTS ; 8.8.1 MEASUREMENT OF MAJOR DIAMETER ; 8.8.2 MEASUREMENT OF MINOR DIAMETER ; 8.8.3 MEASUREMENT OF EFFECTIVE DIAMETER ; 8.8.4 MEASUREMENT OF PITCH ; 8.9 THREAD GAUGES ; 9. : METROLOGY OF SURFACE FINISH ; 9.1 INTRODUCTION ; 9.2 SURFACE METROLOGY CONCEPTS ; 9.3 TERMINOLOGIES ; 9.4 ANALYSIS OF SURFACE TRACES ; 9.4.1 TEN POINT HEIGHT AVERAGE VALUE ; 9.4.2 ROOT MEAN SQUARE VALUE ; 9.4.3 CENTRAL LINE AVERAGE VALUE ; 9.5 SPECIFICATION OF SURFACE TEXTURE CHARACTERISTICS ; 9.6 METHODS OF MEASURING SURFACE FINISH ; 9.7 STYLUS SYSTEM OF MEASUREMENT ; 9.7.1 THE STYLUS AND DATUM ; 9.8 STYLUS PROBE INSTRUMENTS ; 9.8.1 TOMLINSON SURFACE METER ; 9.8.2 TAYLOR-HOBSON TALYSURF ; 9.8.3 PROFILOMETER ; 9.9 WAVELENGTH, FREQUENCY, AND CUTOFF ; 9.10 OTHER METHODS OF MEASURING SURFACE ROUGHNESS ; 9.10.1 PNEUMATIC METHOD ; 9.10.2 LIGHT INTERFERENCE MICROSCOPE ; 9.10.3 MECRIN INSTRUMENT ; 10. : MISCELLANEOUS METROLOGY ; 10.1 INTRODUCTION ; 10.2 PRECISION INSTRUMENTATION BASED ON LASER PRINCIPLES ; 10.3 COORDINATE MEASURING MACHINES (CMM) ; 10.3.1 STRUCTURE OF CMM ; 10.3.2 MODES OF OPERATION ; 10.3.3 THE PROBE ; 10.3.4 OPERATION OF CMM ; 10.3.5 MAJOR APPLICATIONS OF CMM ; 10.4 MACHINE TOOL METROLOGY ; 10.4.1 STRAIGHTNESS, FLATNESS, PARALLELISM, SQUARENESS, ROUNDNESS, CYLINDRICITY, AND RUNOUT ; 10.4.2 ACCEPTANCE TEST FOR MACHINE TOOLS ; 10.5 AUTOMATED INSPECTION ; 10.6 MACHINE VISION ; 10.6.1 STAGES OF MACHINE VISION ; 10.6.2 APPLICATIONS OF MACHINE VISION IN INSPECTION ; 11. : INSPECTION AND QUALITY CONTROL ; 11.1 INTRODUCTION ; 11.2 INSPECTION ; 11.3 SPECIFYING THE LIMITS OF VARIABILITY ; 11.4 DIMENSIONS AND TOLERANCES ; 11.5 SELECTION OF GAUGING EQUIPMENT ; 11.6 GAUGE CONTROL ; 11.7 QUALITY CONTROL AND QUALITY ASSURANCE ; 11.8 STATISTICAL QUALITY CONTROL ; 11.8.1 PROCESS VARIABILITY ; 11.8.2 IMPORTANCE OF SAMPLING ; 11.8.3 SQC BY ATTRIBUTES ; 11.8.4 SQC BY VARIABLES ; 11.9 TOTAL QUALITY MANAGEMENT ; 11.9.1 CUSTOMER FOCUS ; 11.9.2 CONTINUOUS IMPROVEMENT ; 11.9.3 EMPLOYEE EMPOWERMENT ; 11.9.4 USE OF QUALITY TOOLS ; 11.9.5 PRODUCT DESIGN ; 11.9.6 PROCESS MANAGEMENT ; 11.9.7 MANAGING SUPPLIER QUALITY ; 11.10 SIX SIGMA ; 11.10.1 SIX SIGMA APPROACH ; 11.10.2 TRAINING FOR SIX SIGMA ; 11.11 QUALITY STANDARDS ; 11.11.1 QUALITY MANAGEMENT PRINCIPLES OF ISO 9000 ; 11.11.2 IMPLEMENTING ISO STANDARDS ; 12. : MEASUREMENT SYSTEMS ; 12.1 INTRODUCTION ; 12.2 SOME BASIC DEFINITIONS ; 12.2.1 HYSTERESIS IN MEASUREMENT SYSTEMS ; 12.2.2 LINEARITY IN MEASUREMENT SYSTEMS ; 12.2.3 RESOLUTION OF MEASURING INSTRUMENTS ; 12.2.4 THRESHOLD ; 12.2.5 DRIFT ; 12.2.6 ZERO STABILITY ; 12.2.7 LOADING EFFECTS ; 12.2.8 SYSTEM RESPONSE ; 12.3 FUNCTIONAL ELEMENTS OF MEASUREMENT SYSTEMS ; 12.4 PRIMARY DETECTOR-TRANSDUCER STAGE ; 12.5 THE INTERMEDIATE MODIFYING STAGE ; 12.6 THE OUTPUT OR TERMINATING STAGE ; 13. : TRANSDUCERS ; 13.1 INTRODUCTION ; 13.2 TRANSFER EFFICIENCY ; 13.3 CLASSIFICATION OF TRANSDUCERS ; 13.3.1 PRIMARY AND SECONDARY TRANSDUCERS ; 13.3.2 BASED ON PRINCIPLES OF TRANSDUCTION ; 13.3.3 ACTIVE AND PASSIVE TRANSDUCERS ; 13.3.4 ANALOG AND DIGITAL TRANSDUCERS ; 13.3.5 TRANSDUCERS AND INVERSE TRANSDUCERS ; 13.3.6 NULL AND DEFLECTION TYPE TRANSDUCERS ; 13.4 QUALITY ATTRIBUTES FOR TRANSDUCERS ; 13.5 INTERMEDIATE MODIFYING DEVICES ; 13.5.1 INHERENT PROBLEMS IN MECHANICAL SYSTEMS ; 13.5.2 KINEMATIC LINEARITY ; 13.5.3 MECHANICAL AMPLIFICATION ; 13.5.4 REFLECTED FRICTIONAL AMPLIFICATION ; 13.5.5REFLECTED INERTIAL AMPLIFICATION ; 13.5.6 AMPLIFICATION OF BACKLASH AND ELASTIC DEFORMATION ; 13.5.7 TOLERANCE PROBLEMS ; 13.5.8 TEMPERATURE PROBLEMS ; 13.6 ELECTRICAL INTERMEDIATE MODIFYING DEVICES ; 13.6.1 INPUT CIRCUITRY ; 13.6.2 SIMPLE CURRENT SENSITIVE CIRCUIT ; 13.6.3 BALLAST CIRCUIT ; 13.6.4 ELECTRONIC AMPLIFIERS ; 13.6.5 TELEMETRY ; 13.7 ADVANTAGES OF ELECTRICAL INTERMEDIATE MODIFYING DEVICES ; 13.8 TERMINATING DEVICES ; 13.8.1 METERING INDICATORS ; 13.8.2 MECHANICAL COUNTERS ; 13.8.3 CATHODE RAY OSCILLOSCOPE (CRO) ; 13.8.4 OSCILLOGRAPHS ; 13.8.5 X-Y PLOTTERS ; 13.8.6 STROBOSCOPIC MEASUREMENTS ; 14. : MEASUREMENT OF FORCE, TORQUE, AND STRAIN ; 14.1 INTRODUCTION ; 14.2 MEASUREMENT OF FORCE ; 14.2.1 DIRECT METHODS ; 14.3 ELASTIC MEMBERS ; 14.3.1 LOAD CELLS ; 14.3.2 CANTILEVER BEAMS ; 14.3.3 PROVING RINGS ; 14.3.4 DIFFERENTIAL TRANSFORMERS ; 14.4 MEASUREMENT OF TORQUE ; 14.4.1 TORSION BAR DYNAMOMETER ; 14.4.2 SERVO CONTROLLED DYNAMOMETERS ; 14.4.3 ABSORPTION DYNAMOMETERS ; 14.5 MEASUREMENT OF STRAIN ; 14.5.1 MECHANICAL STRAIN GAUGES ; 14.5.2 ELECTRICAL STRAIN GAUGES ; 14.6 STRAIN GAUGE MATERIALS ; 14.7 BACKING OR CARRIER MATERIALS ; 14.9 ADHESIVES ; 14.10 PROTECTIVE COATINGS ; 14.11 BONDING OF GAUGES ; 14.12 GAUGE FACTOR ; 14.13 THEORY OF STRAIN GAUGES ; 14.14 METHODS OF STRAIN MEASUREMENTS ; 14.15 STRAIN GAUGE BRIDGE ARRANGEMENT ; 14.16 TEMPERATURE COMPENSATION IN STRAIN GAUGES ; 14.16.1 ADJACENT ARM COMPENSATING GAUGES ; 14.16.2 SELF TEMPERATURE COMPENSATION ; 15. : TEMPERATURE MEASUREMENT ; 15.1 INTRODUCTION ; 15.2 METHODS OF MEASURING TEMPERATURE ; 15.3 THERMOCOUPLES ; 15.3.1 LAW OF THERMOCOUPLES ; 15.3.2 THERMOCOUPLE MATERIALS ; 15.3.3 THERMOPILES ; 15.4 RESISTANCE TEMPERATURE DETECTORS (RTD) ; 15.5 THERMISTORS ; 15.6 LIQUID IN GLASS THERMOMETERS ; 15.7 PRESSURE THERMOMETERS ; 15.8 BIMETALLIC STRIP THERMOMETERS ; 15.9 PYROMETRY ; 15.9.1 TOTAL RADIATION PYROMETER ; 15.9.2 OPTICAL PYROMETER ; 15.9.3 FIBRE OPTIC PYROMETERS ; 16. : PRESSURE MEASUREMENT ; 16.1 INTRODUCTION ; 16.2 PRESSURE MEASUREMENT SCALES ; 16.3 METHODS OF PRESSURE MEASUREMENT ; 16.3.1 STATIC PRESSURE MEASUREMENT ; 16.3.2 CLASSIFICATION OF PRESSURE MEASURING DEVICES ; 16.3.3 MANOMETERS FOR PRESSURE MEASUREMENT ; 16.4 RING BALANCE ; 16.5 INVERTED BELL MANOMETER ; 16.6 ELASTIC TRANSDUCERS ; 16.7 ELASTIC PRESSURE TRANSDUCERS ; 16.7.1 RESISTANCE TYPE TRANSDUCERS ; 16.7.2 POTENTIOMETER DEVICES ; 16.7.3 INDUCTIVE TYPE TRANSDUCER ; 16.7.4 CAPACITIVE TYPE PRESSURE TRANSDUCER ; 16.7.5 PIEZO ELECTRIC TYPE PRESSURE TRANSDUCER ; 16.7.6 VARYING PRESSURE MEASUREMENT ; 16.8 DEAD WEIGHT PRESSURE GAUGE ; 16.9 MEASUREMENT OF VACUUM ; 16.9.1 MCLEOD GAUGE ; 16.9.2 PIRANI GAUGE ; 16.9.3 IONIZATION GAUGE ; 16.9.4 KNUDSEN GAUGE ; 16.10 MEASUREMENT OF HIGH PRESSURE ; 17. : NANOMETROLOGY ; 17.1 INTRODUCTION ; 17.2 NANOTECHNOLOGY ; 17.2.1 IMPORTANCE OF NANO DIMENSION ; 17.2.1 CLASSIFICATION OF NANOSTRUCTURES ; 17.2.3 APPLICATIONS ; 17.3 IMPORTANCE OF NANOMETROLOGY ; 17.4 INTRODUCTION TO MICROSCOPY ; 17.4.1 TRANSMISSION ELECTRON MICROSCOPE (TEM) ; 17.4.2 SCANNING ELECTRON MICROSCOPE (SEM) ; 17.4.3 SCANNING TUNNELLING MICROSCOPE (STM) ; 17.4.4 ATOMIC FORCE MICROSCOPE (AFM) ; 17.5 X-RAY DIFFRACTION SYSTEM (XRD) ; APPENDIX A: UNIVERSAL MEASURING MACHINE ; APPENDIX B: FLUID FLOW MEASUREMENTS ; APPENDIX C: LABORATORY MANUAL ; APPENDIX D: QUALITY CONTROL CHARTS