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Monte Carlo Modeling for Electron Microscopy and Microanalysis
Monte Carlo Modeling for Electron Microscopy and Microanalysis
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International Edition


About the Book

This book describes for the first time how Monte Carlo modeling methods can be applied to electron microscopy and microanalysis. Computer programs for two basic types of Monte Carlo simulation are developed from physical models of the electron scattering process--a single scattering program capable of high accuracy but requiring long computation times, and a plural scattering program which is less accurate but much more rapid. Optimized for use on personal computers, the programs provide a real time graphical display of the interaction. The programs are then used as the starting point for the development of programs aimed at studying particular effects in the electron microscope, including backscattering, secondary electron production, EBIC and cathodo-luminescence imaging, and X-ray microanalysis. The computer code is given in a fully annotated format so that it may be readily modified for specific problems. Throughout, the author includes numerous examples of how such
applications can be used. Students and professionals using electron microscopes will want to read this important addition to the literature.


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Product Details
  • ISBN-13: 9780195088748
  • Publisher: Oxford University Press, USA
  • Publisher Imprint: Oxford University Press, USA
  • Height: 234 mm
  • No of Pages: 224
  • Series Title: Oxford Optical and Imaging Sciences
  • Weight: 499 gr
  • ISBN-10: 0195088743
  • Publisher Date: 13 Apr 1995
  • Binding: Hardback
  • Language: English
  • Returnable: N
  • Spine Width: 14 mm
  • Width: 156 mm


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