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Polycrystalline Semiconductors IV: (Volumes 51-52 Solid State Phenomena)

Polycrystalline Semiconductors IV: (Volumes 51-52 Solid State Phenomena)

          
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About the Book

The present volume covers many aspects of semiconductors, over the wide structural range from nano- to large-grained crystalline. Scientists working on polycrystalline semiconductors, with various chemistries, here review fundamental research, technology and applications.

Table of Contents:
Preface Annihilation of Self-Interstitials by Dislocations in Silicon as Studied by Gold Diffusion Formation of Electrical Activity of Dislocations in Si during Plastic Deformation Electronic and Electrical Properties of Polycrystalline Silicon: Effects of Grain Boundary Segregation Atomic Simulation Study of Gettering and Passivation in Polycrystalline Semiconductors The Switching Effects at Grain Boundaries Spontaneously Nucleating at the Crystallization Front of Shaped Silicon Microcharacterization of Polycrystalline Semiconductors by Scanning Electron Microscopy in Electron Beam Induced Current Mode Beam Injection Methods as Tools for Studying Extended Defects in Semiconductors: Characteristics and Capabilities Scanning Deep Level Transient Spectroscopy Measurements of Extended Defects in Silicon Lifetime and Material Characteristics of Multicrystalline Silicon Measured with High Spatial Resolution On the Electrical Activity of Fe-Contaminated Silicon Bicrystals Microdefects in Polycrystalline Silicon Investigations for the Detection of Microdefects in Cast Multicrystalline Silicon Dislocation-Related Absorption, Photoluminescence and Birefringence in Deformed n-ZnSe Crystals Tight-Binding Total Energy Calculation for Fe, Co and Ni in Silicon Polycrystalline Semiconductors: Structure-Property Relationships Influence of a Preliminary Phosphorus Diffusion on the Evaluation of the Recombination Strenght of Dislocations in Czochralski Silicon Wafers Reconstruction of the Recombination Centre Distribution in Dislocation Impurity Atmosphere in Si Transmission Electron Microscopy Studies of Lattice-Mismatched Semiconductor Heterostructures Used for Integrated Optoelectronic Devices Electrical and Structural Properties of Solution Grown Silicon Layers on Polycrystalline Silicon Substrates Preparation of Low Temperature Polysilicon Films with SiH4 and SiF4 Gas Mixtures Structural Studies of Annealing Effects on Semi-Insulating Polycrystalline Layers Obtained by Using Disilane Growth of n-Type Microcrystalline Silicon at Different Plasma Excitation Frequencies On the Nanostructure of Hydrogenated Silicon Time Resolved Reflectivity Studies of Phase Transitions in Polycrystalline Si Induced by Excimer Laser Irradiation Characterization of Low Pressure Chemical Vapor Deposited Polysilicon Using Ellipsometry Correlation between the Hydrogen Bonding Configurations in Amorphous Sputtered Silicon and the Crystallized Material Microstructure Growth and Defect Formation in Thin Ge and Si0.8Ge0.2 Layers Ion Beam Sputter Deposited on Si(001) Microstructure Influence on the First Stage of the Oxidation Process in Polycrystalline SiGe Layers Surface Defect States of Crystallites in Sputtered Amorphous Silicon Films n-Type Polydrystalline Silicon for Luminescent Porous Silicon Films Structural Characterization of Poly-SiC Grown on SiO2/Si by Metalorganic Chemical Vapor Deposition Photoluminescence from Nanocrystalline Silicon-Amorphous Silica Composite Materials: Changing the Color and Decay Time Nanocrystalline Silicon: From Disordered Insulator to Dirty Metal Optical, Electrical and Structural Studies of Microcrystallized Sputtered Silicon Structure and Optical Properties of Hydrogenated Silicon Films Prepared by Plasma Enhanced Chemical Vapour Deposition Growth of Polycrystalline Silicon Films at High Deposition Rate and Low Temperature by Hot Wire Chemical Vapour Deposition Grain Boundaries and Grain Size Distributions in Nanocrystalline Diamond Films Derived from Fullerene Precursors Cathodoluminescence Microscopy of Square Facets in Chemial Vapour Deposited Diamond Films and its Use in Stress Determination Transformations in Si1-xGex:H Films on SiO2 Substrates Modelling of Specular Reflection Infrared Spectra of Oxide Films for Microstructural Analysis Chemical Composition and Characterization of the Si/C Interface in Poly-Si Thin Films on Graphite Substrates Phase Transitions during the Deposition of Polycrystalline Iron Pyrite (FeS2) - Layers by Low-Pressure Metalorganic Chemical Vapor Deposition Distribution of Defects in Polycrytalline Chalcopyrite Thin Films Noble Transparent Semiconductor: MgIn2O4 Electronic Properties of CuxS-ZnS Heterostructure in Zinc Sulphide Luminophors Quantum Properties of Two-Dimensional Electron Gas in the Inversion Layer of InSb and (Hg1-xCdxTe) Bicrystals Growth and Electrical Properties of Reactively Sputtered WSx Thin Films Optical and Electrical Properties of Iron Disilicide with Different Degree of Structural Perfection Composition Dependent Optical Properties of Polycrystalline CuInSe2 Thin Films Improvement of the Electrical Properties of WSe2 Layers by Iodine Treatment Electron Beam Induced Current Imaging of Silicon Oxide Damage Due to Reactive Ion Etching Monte Carlo Simulation of Charge Carriers' Trapping in Polycrystalline Semiconductors Electronic Properties of Defect Levels Investigated by Photocurrent Noise in Polycrystalline Cadmium Compounds Experimental Determination of Hall Factor for Hydrogenated In-Situ Phosphorus Doped Polysilicon Films Carrier Transport at Silicon and Germanium Grain Boundaries Enriched by Impurities 1/f Noise Transformation that Accompanies the Trimming of Polycrystalline Silicon Layers Investigation of the Low-Frequency Electrical Noise in Grain Boundaries and Polycrystalline Silicon Films Selective Photoconductivity in n-Type CdMnTe:Ga Semiconducting Gas Sensors: Basic Science and Empirical Approaches Influence of the Technological Parameters on the Mechanical Properties of Thick Epipolysilicon Layers for Micromechanical Sensors Thickness Dependence of Coloration of Anodic Tungsten Oxide Films for Hydrogen Detection Preparation, Micromorphology and Stability of Tin Dioxide Thin Films Microstructural Study of Nanocrystalline Semiconducting SnO2 Powders for Sensor Application Growth and Post Growth Processes of Multicrystalline Silicon for Photovoltaic Use Modern Technologies for Polycrystalline Silicon Solar Cells Microstructure and Electrical Properties of some Multicrystalline Silicon Billets Continuously Cast in a Cold Crucible Polycrystalline Silicon Solar Cells: Improvements in Efficiency through Hydrogen Passivation About a Novel Gettering Procedure for Multicrystalline Silicon Samples Hydrogen Ion-Implantation Induced Gettering Effects in Polycrystalline Silicon Shunts in n+p-Junction Solar Cells Fabricated on Multicrystalline Cast Silicon Characterization of Local Shunts in Multicrystalline Siicon Solar Cells by p-n Mesa Structures Theory of Grain Boundary Effects upon Single Junction and Multijunction Polycrystalline Silicon Thin Film Solar Cells Polycrystalline Silicon on Glass Substrates for Thin Film Solar Cells Modelling of Thin Polycrystalline Silicon Solar Cells on Low Temperature Substrates Electron-Beam Induced Current Profiles for Thin Film Heterojunction Analysis Oxygen in Solution Grown CdS Films for Thin Film Solar Cells Relations between Texture and Electrical Parameters of Thin Polycrystalline Zinc Oxide Films Interface Charge Separation Processes in TiO2-Based Solar Cells Structure Organization of Fullerene Layers for Photovoltaic Devices Compensation Doping of Polysilicon Films for Stable Integrated Circuit Resistors Physical Properties of Polysilicon Diodes Derived from a Smart Power Technology Realization of Power Polysilicon Diodes on Indium-Tin-Oxide Substrates for Holographic Commutation Matrix Manipulating the Electrical and Optical Properties of Polycrystalline ZnO Based Thin Films Analysis of Hot-Carrier Effects, 'Kink' Effect and Low Frequency Noise in Polycrystalline Silicon Thin-Film Transistors Thermal and Field-Induced Generation Mechanisms in Polysilicon Thin Film Transistors: A Comparison between n-Channel and p-Channel Devices Thin Polycrystalline Silicon Films Annealed at 950°C: Structural and Electrical Properties and Application to Thin Film Transistors Deposition and Characterisation of Polycrystalline Silicon for Low Temperature Thin Film Transistor Fabrication Novel Polysilicon Thin Film Transistor with Buffer Oxide Leakage Currents in Poly-Si Thin Film Transistors


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Product Details
  • ISBN-13: 9783035706659
  • Publisher: Trans Tech Publications Ltd
  • Publisher Imprint: Trans Tech Publications Ltd
  • Language: English
  • Series Title: Volumes 51-52 Solid State Phenomena
  • ISBN-10: 3035706654
  • Publisher Date: 23 May 1996
  • Binding: Digital download and online
  • No of Pages: 656


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