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Surface Analysis with STM and AFM: Experimental and Theoretical Aspects of Image Analysis

Surface Analysis with STM and AFM: Experimental and Theoretical Aspects of Image Analysis

          
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About the Book

Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. In the past, many STM and AFM studies led to erroneous conclusions due to lack of proper theoretical considerations and of an understanding of how image patterns are affected by measurement conditions. For this book, two world experts, one on theoretical analysis and the other on experimental characterization, have joined forces to bring together essential components of STM and AFM studies: The practical aspects of STM, the image simulation by surface electron density plot calculations, and the qualitative evaluation of tip-force induced surface corrugations.

Practical examples are taken from: inorganic layered materialsorganic conductorsorganic adsorbates at liquid-solid interfacesself-assembled amphiphilespolymers

This book will be an invaluable reference work for researchers active in STM and AMF as well as for newcomers to the field.



Table of Contents:
Part 1 Introduction: development of scanning probe microscopy; key problems of STM and AFM applications. Part 2 Physical phenomena relevant to STM and AFM: electron transport processes; survey of force interactions. Part 3 Scanning probe microscopes: operating principles and main components; scanning tunnelling microscope; atomic force microscope; STM and AFM as metrology tools. Part 4 Practical aspects of STM and AFM measurements: samples; optimization of experiments; STM and AFM measurements. Part 5 Simulations of STM and AFM images: electronic structures of solids; theoretical aspects of STM; theoretical aspects of AFM; image simulation by density plot calculations. Part 6 STM and AFM images of layered inorganic compounds: layers from MX6 trigonal prisms and octahedra; images of layered compounds; charge density waves of MC8 (M=K, Rb, Cs). Part 7 STM images associated with point defects of layered inorganic compounds: imperfections in compounds with metal clusters; point defects in semiconductor 2H-MoS2; cases tractable by electronic band structure calculations; cases intractable by electronic band calculations; survey of image imperfections observed for d2 2H-MX2 systems. Part 8 Tip-sample interactions: electronic interactions in STM; force interactions in STM; tip-sample interactions in AFM. Part 9 Surface relaxation in STM and AFM images: tip force induced deformation in HOPG; wagon-wheel patterns of MoSe2 epilayers on MoS2; STM and AFM images of alpha-RuCI3 and alpha-MoCI3; layered transition-metal tellurides MAxTe2; tip force induced changes in AFM images of NbTe2; nanoscale ring structure of MoS2 and WSe2. Part 10 Organic conducting salts: crystal and electronic structures; early STM studies of organic conductors; STM and AFM imaging of organic conductors; analysis of the images of TCNQ salts; analysis of the images of BEDT-TTF salts. Part 11 Organic adsorbates at liquid/solid interfaces: STM of organic adsorbates; STM of normal and cyclic alkane layers; influence of substrate on adsorbate structure. Part 12 Self-assembled structure: scanning probe microscopy studies of thin organic films; self-organization of amphiphiles; AFM study of N-(n-alkyl)-D-gluconamides; AFM study of N-(n-alkyl)-N-D-maltosylsemicarbazones. Part 13 Polymers: general considerations; STM of polymer samples; AFM of polymer crystal surfaces; ARM of oriented polymers; AFM of di-block copolymers.


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Product Details
  • ISBN-13: 9783527293131
  • Publisher: Wiley-VCH Verlag GmbH
  • Publisher Imprint: Wiley-VCH Verlag GmbH
  • Height: 245 mm
  • No of Pages: 300
  • Spine Width: 20 mm
  • Weight: 795 gr
  • ISBN-10: 3527293132
  • Publisher Date: 18 Jan 1996
  • Binding: Hardback
  • Language: English
  • Returnable: N
  • Sub Title: Experimental and Theoretical Aspects of Image Analysis
  • Width: 175 mm


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