Humburger Icon
Logo1
close menu
Bookswagon-24x7 online bookstore
close menu
My Account
Home icon Home
Account Icon Account
Wishlist Icon Wishlist
Cart Icon Cart
Bookswagon icon Menu
Close

Refine your Search

By Price

Availability

Shipping Time

Source

Binding

Language

Publication Year

Filter By Category
Anthony S Oates

Anthony S Oates

4 results found
List viewGrid view
Sort By:
1.
Reliability for Logic and Memory Technologies
Reliability for Logic and Memory Technologies
By: Anthony S. Oates, etc.
Publisher: I.E.E.E.Press
No Review Yet
₹51,843
Binding:
VHS video
Release:
01 Feb 1999
Language:
English
Out of Stock
Notify me when this book is in stockNotify Me
2.
Accelerated Stress Testing (PAL)
Accelerated Stress Testing (PAL)
By: H Anthony Chan, Anthony S Oates, Charles Felkins, T Paul Parker
Publisher: I.E.E.E.Press
No Review Yet
₹1,00,616
Binding:
Video
Release:
01 Jan 2001
Language:
English
Out of Stock
Notify me when this book is in stockNotify Me
3.
Materials Reliability in Microelectronics VI: Volume 428NR
Materials Reliability in Microelectronics VI: Volume 428
By: Anthony S. Oates, William F. Filter, J. Joseph Clement, Patrick M. Lenahan, Robert Rosenberg
Publisher: Materials Research Society
No Review Yet
₹2,251
Binding:
Hardback
Release:
18 Nov 1996
Language:
English
Out of Stock
Notify me when this book is in stockNotify Me
4.
Materials Reliability in Microelectronics V: Volume 391NR
Materials Reliability in Microelectronics V: Volume 391
By: Anthony S. Oates, William F. Filter, Kamesh Gadepally, A. Lindsay Greer, Robert Rosenberg
Publisher: Materials Research Society
No Review Yet
₹2,189
Binding:
Hardback
Release:
24 Oct 1995
Language:
English
Out of Stock
Notify me when this book is in stockNotify Me
No more records found
ASK VIDYA