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William F. Filter

William F. Filter

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1.
Materials Reliability in Microelectronics III: Volume 30937 %
Materials Reliability in Microelectronics III: Volume 309
By: William F. Filter, Paul S. (University of Texas, Austin) Ho, Harold J. (Dartmouth College, New Hampshire) Frost, Harold J Frost, Kenneth P Rodbell
Publisher: Cambridge University Press
No Review Yet
₹2,768
₹1,744
Binding:
Hardback
Release:
31 Aug 1993
Language:
English
Available
Ships within 1-2 Days Explain..
2.
Materials Reliability in Microelectronics III: Volume 30915 % POD/NR
Materials Reliability in Microelectronics III: Volume 309
By: William F. Filter, Paul S. (University of Texas, Austin) Ho, Harold J. (Dartmouth College, New Hampshire) Frost, Harold J Frost, Kenneth P Rodbell
Publisher: Cambridge University Press
No Review Yet
₹2,940
₹2,499
Binding:
Paperback
Release:
05 Jun 2014
Language:
English
International Edition
Ships within 14-16 Days Explain..
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Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
3.
Materials Reliability in Microelectronics V: Volume 391NR
Materials Reliability in Microelectronics V: Volume 391
By: William F. Filter, Kamesh Gadepally, Robert Rosenberg, Robert (IBM T J Watson Research Center, New York) Rosenberg, A. Lindsay (University of Cambridge) Greer
Publisher: Materials Research Society
No Review Yet
₹2,189
Binding:
Hardback
Release:
24 Oct 1995
Language:
English
Out of Stock
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4.
Materials Reliability in Microelectronics IV: Volume 338NR
Materials Reliability in Microelectronics IV: Volume 338
By: Peter Borgesen, William F. Filter, Kenneth P. Rodbell, John C. Coburn, John E., Jr. Sanchez
Publisher: Materials Research Society
No Review Yet
₹2,270
Binding:
Hardback
Release:
19 Oct 1994
Language:
English
Out of Stock
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5.
Materials Reliability in Microelectronics VI : Volume 428NR
Materials Reliability in Microelectronics VI : Volume 428
By: Anthony S. Oates, William F. Filter, Robert Rosenberg, Robert (IBM T J Watson Research Center, New York) Rosenberg, J Joseph Clement
Publisher: Materials Research Society
No Review Yet
₹2,251
Binding:
Hardback
Release:
18 Nov 1996
Language:
English
Out of Stock
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