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1.
VLSI Test Principles and Architectures45 %
VLSI Test Principles and Architectures
By: Charles Stroud, Benoit Nadeau-Dostie, Abhijit Chatterjee, Laung-Terng Wang, Cheng-Wen Wu
Publisher: Elsevier Science & Technology
No Review Yet
₹8,231
₹4,527
Binding:
Hardback
Release:
14 Aug 2006
Language:
English
Available
Ships within 16-18 Days Explain..
2.
Design for AT-Speed Test, Diagnosis and Measurement59 %
Design for AT-Speed Test, Diagnosis and Measurement
By: Benoit Nadeau-Dostie
Publisher: Kluwer Academic Publishers
No Review Yet
₹18,614
₹7,632
Binding:
Hardback
Release:
30 Sep 1999
Language:
English
Available
Ships within 1-2 Days Explain..
3.
Design for AT-Speed Test, Diagnosis and Measurement37 %
Design for AT-Speed Test, Diagnosis and Measurement
By: Benoit Nadeau-Dostie
Publisher: Springer-Verlag New York Inc.
No Review Yet
₹16,424
₹10,347
Binding:
Paperback
Release:
26 Apr 2013
Language:
English
Available
Ships within 12-14 Days Explain..
4.
Design for At-Speed Test, Diagnosis and Measurement
Design for At-Speed Test, Diagnosis and Measurement
By: Benoit Nadeau-Dostie
Publisher: Springer
No Review Yet
₹9,012
Binding:
Graphic Novel
Release:
01 Jan 1999
Out of Stock
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5.
Design for At-Speed Test, Diagnosis and Measurement
Design for At-Speed Test, Diagnosis and Measurement
By: Benoit Nadeau-Dostie
Publisher: Springer
No Review Yet
₹15,312
Binding:
Paperback
Release:
15 Jan 2014
Out of Stock
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6.
Design for at-Speed Test, Diagnosis and Measurement
Design for at-Speed Test, Diagnosis and Measurement
By: Benoit Nadeau-Dostie (LogicVision Inc., Ottawa, ON, Canada)
Publisher: Kluwer Academic Publishers Group
No Review Yet
₹9,012
Binding:
Digital online
Release:
/12/2000
Language:
English
Out of Stock
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