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45 %

VLSI Test Principles and Architectures

By: Charles Stroud, Benoit Nadeau-Dostie, Abhijit Chatterjee, Laung-Terng Wang, Cheng-Wen Wu

Publisher: Elsevier Science & Technology

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₹8,172

₹4,495

Binding:	Hardback
Release:	14 Aug 2006
Language:	English

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45 %

System-on-Chip Test Architectures

By: Laung-Terng Wang, Charles E. Stroud, Nur A. Touba

Publisher: Elsevier Science & Technology

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₹7,718

₹4,245

Binding:	Hardback
Release:	08 Jan 2008
Language:	English

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45 %

Electronic Design Automation

By: Laung-Terng Wang, Yao-Wen Chang, Kwang-Ting (Tim) Cheng

Publisher: Elsevier Science & Technology

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₹9,994

₹5,497

Binding:	Hardback
Release:	26 Mar 2009
Language:	English

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VLSI Test Principles and Architectures

By: Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen

Publisher: Morgan Kaufmann Publishers

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₹6,965

Binding:	Digital (delivered electronically)
Release:	14 May 2014
Language:	English

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System-On-Chip Test Architectures

By: Charles Stroud, Laung-Terng Wang, Nur A Touba

Publisher: Morgan Kaufmann Publishers

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₹6,540

Binding:	Digital (delivered electronically)
Release:	14 May 2014
Language:	English

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VLSI Test Principles and Architectures

By: Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen

Publisher: Morgan Kaufmann Publishers

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₹7,688

Binding:	Paperback
Release:	21 Jul 2006
Language:	English

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