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D Keith Bowen

D Keith Bowen

7 results found
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1.
X-Ray Metrology in Semiconductor Manufacturing
X-Ray Metrology in Semiconductor Manufacturing
By: Brian K. Tanner, D. Keith Bowen
Publisher: Taylor & Francis Inc
No Review Yet
₹20,176
Binding:
Hardback
Release:
24 Jan 2006
Language:
English
Available
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2.
X-Ray Metrology in Semiconductor Manufacturing
X-Ray Metrology in Semiconductor Manufacturing
By: D Keith Bowen
Publisher: CRC Press
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₹0
Binding:
Digital (delivered electronically)
Release:
24 Jan 2006
Out of Stock
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3.
X-Ray Metrology in Semiconductor Manufacturing
X-Ray Metrology in Semiconductor Manufacturing
By: Brian K Tanner, D Keith Bowen
Publisher: CRC Press
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₹16,669
Binding:
Undefined
Release:
01 Jan 2006
Out of Stock
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4.
High Resolution X-Ray Diffractometry and Topography
High Resolution X-Ray Diffractometry and Topography
By: Brian K Tanner, D Keith Bowen
Publisher: Taylor & Francis Group
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₹0
Binding:
Digital (delivered electronically)
Release:
01 Jan 1998
Out of Stock
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