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Brian K. Tanner

Brian K. Tanner

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1.
X-Ray Metrology in Semiconductor Manufacturing
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₹20,176
Binding:
Hardback
Release:
24 Jan 2006
Language:
English
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2.
High Resolution X-Ray Diffractometry And Topography47 %
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₹9,239
₹4,897
Binding:
Paperback
Release:
10 Oct 2019
Language:
English
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4.
High Resolution X-Ray Diffractometry And Topography47 %
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₹26,400
₹13,992
Binding:
Hardback
Release:
05 Feb 1998
Language:
English
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5.
X-Ray and Neutron Dynamical Diffraction36 %
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₹5,724
₹3,663
Binding:
Paperback
Release:
24 Oct 2012
Language:
English
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7.
X-Ray Metrology in Semiconductor Manufacturing
Publisher: CRC Press
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₹16,669
Binding:
Undefined
Release:
01 Jan 2006
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8.
High Resolution X-Ray Diffractometry and Topography
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₹0
Binding:
Digital (delivered electronically)
Release:
01 Jan 1998
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9.
High Resolution X-Ray Diffractometry And Topography
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₹8,112
Binding:
Digital (delivered electronically)
Release:
05 Feb 1998
Language:
English
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10.
High Resolution X-Ray Diffractometry And Topography
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₹4,536
Binding:
Digital (delivered electronically)
Release:
01 Nov 2005
Language:
English
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11.
High Resolution X-Ray Diffractometry And Topography
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₹4,536
Binding:
Digital (delivered electronically)
Release:
01 Nov 2005
Language:
English
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12.
High Resolution X-Ray Diffractometry And Topography
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₹7,090
Binding:
Digital (delivered electronically)
Release:
05 Feb 1998
Language:
English
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13.
High Resolution X-Ray Diffractometry And Topography
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₹6,132
Binding:
Digital (delivered electronically)
Release:
05 Feb 1998
Language:
English
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14.
X-Ray and Neutron Dynamical Diffraction
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₹0
Binding:
Paperback
Release:
31 Jan 1997
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15.
Introduction to the Physics of Electrons in Solids2 % NR
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₹36,000
₹35,164
Binding:
Digital download and online
Release:
05 Jun 2012
Language:
English
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