Brian K. Tanner

Brian K. Tanner

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1.
High Resolution X-Ray Diffractometry And Topography48 %
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₹8,097
₹4,210
Binding:
Paperback
Release:
10 Oct 2019
Language:
English
Available
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3.
X-Ray and Neutron Dynamical Diffraction36 %
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₹5,307
₹3,396
Binding:
Paperback
Release:
24 Oct 2012
Language:
English
Available
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6.
X-Ray Metrology in Semiconductor Manufacturing31 %
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₹22,895
₹15,798
Binding:
Hardback
Release:
24 Jan 2006
Language:
English
Out of Stock
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7.
X-Ray Metrology in Semiconductor Manufacturing
Publisher: CRC Press
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₹16,669
Binding:
Undefined
Release:
01 Jan 2006
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8.
Introduction to the Physics of Electrons in Solids2 % NR
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₹36,000
₹35,164
Binding:
Digital download and online
Release:
05 Jun 2012
Language:
English
Out of Stock
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