D.K. Bowen

D.K. Bowen

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1.
High Resolution X-Ray Diffractometry And Topography43 %
Publisher: CRC Press
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₹18,725
₹10,673
Binding:
Hardback
Release:
05 Feb 1998
Language:
English
Available
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2.
Advances in X-Ray Analysis37 %
Publisher: Springer
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₹28,140
₹17,728
Binding:
Hardback
Release:
01 Sep 1995
Language:
English
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3.
High Resolution X-Ray Diffractometry And Topography3 % NR
Publisher: Taylor and Francis
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₹6,716
₹6,515
Binding:
Paperback
Release:
12 Oct 2019
Language:
English
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