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K Goel Sandeep

K Goel Sandeep

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1.
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits48 %
No Review Yet
₹11,092
₹5,768
Binding:
Paperback
Release:
29 Mar 2017
Language:
English
Available
Ships within 14-16 Days Explain..
2.
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
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₹13,213
Binding:
Hardback
Release:
25 Oct 2013
Language:
English
Available
Ships within 8-10 Days Explain..
3.
Advancements in Forensic Analysis of Digital Images for Security and Law Enforcement43 % NR
Publisher: IGI Global
No Review Yet
₹17,483
₹9,965
Binding:
Paperback
Release:
21 Jan 2026
Language:
English
International Edition
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4.
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
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₹10,539
Binding:
Digital (delivered electronically)
Release:
19 Dec 2017
Language:
English
Out of Stock
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5.
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
No Review Yet
₹8,792
Binding:
Digital (delivered electronically)
Release:
19 Dec 2017
Language:
English
Out of Stock
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