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Brian M Bowen

Brian M Bowen

4 results found
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1.
High Resolution X-Ray Diffractometry And Topography41 %
High Resolution X-Ray Diffractometry And Topography
By: D.K. Bowen, Brian K. Tanner
Publisher: Taylor & Francis Ltd
No Review Yet
₹23,313
₹13,755
Binding:
Hardback
Release:
05 Feb 1998
Language:
English
Available
Ships within 12-14 Days Explain..
2.
High Resolution X-Ray Diffractometry And Topography6 % NR
High Resolution X-Ray Diffractometry And Topography
By: D.K. Bowen, Brian K. Tanner
Publisher: Taylor & Francis Ltd
No Review Yet
₹7,886
₹7,413
Binding:
Paperback
Release:
10 Oct 2019
Language:
English
International Edition
Ships within 14-16 Days Explain..
Free Shipping in India and low cost Worldwide.
3.
X-Ray Metrology in Semiconductor Manufacturing31 %
X-Ray Metrology in Semiconductor Manufacturing
By: Brian K. Tanner, D. Keith Bowen
Publisher: Taylor & Francis Inc
No Review Yet
₹22,895
₹15,798
Binding:
Hardback
Release:
24 Jan 2006
Language:
English
Out of Stock
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4.
Methods, systems, and media for detecting covert malware9 % NR
Methods, systems, and media for detecting covert malware
By: Brian M Bowen
Publisher: Independently Published
No Review Yet
₹1,008
₹917
Binding:
Paperback
Release:
28 Dec 2020
Language:
English
Out of Stock
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