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Advances in Embedded and Fan-Out Wafer Level Packaging Technologies: (IEEE Press)

Advances in Embedded and Fan-Out Wafer Level Packaging Technologies: (IEEE Press)

          
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About the Book

Examines the advantages of Embedded and FO-WLP technologies, potential application spaces, package structures available in the industry, process flows, and material challenges Embedded and fan-out wafer level packaging (FO-WLP) technologies have been developed across the industry over the past 15 years and have been in high volume manufacturing for nearly a decade. This book covers the advances that have been made in this new packaging technology and discusses the many benefits it provides to the electronic packaging industry and supply chain. It provides a compact overview of the major types of technologies offered in this field, on what is available, how it is processed, what is driving its development, and the pros and cons. Filled with contributions from some of the field's leading experts,Advances in Embedded and Fan-Out Wafer Level Packaging Technologies begins with a look at the history of the technology. It then goes on to examine the biggest technology and marketing trends. Other sections are dedicated to chip-first FO-WLP, chip-last FO-WLP, embedded die packaging, materials challenges, equipment challenges, and resulting technology fusions. Discusses specific company standards and their development results Content relates to practice as well as to contemporary and future challenges in electronics system integration and packaging Advances in Embedded and Fan-Out Wafer Level Packaging Technologies will appeal to microelectronic packaging engineers, managers, and decision makers working in OEMs, IDMs, IFMs, OSATs, silicon foundries, materials suppliers, equipment suppliers, and CAD tool suppliers. It is also an excellent book for professors and graduate students working in microelectronic packaging research.

Table of Contents:
Preface xvii List of Contributors xxiii Acknowledgments xxvii 1 History of Embedded and Fan-Out Packaging Technology 1 Michael Topper, Andreas Ostmann, Tanja Braun, and Klaus-Dieter Lang 2 FO-WLP Market and Technology Trends 39 E. Jan Vardaman 3 Embedded Wafer-Level Ball Grid Array (eWLB) Packaging Technology Platform 55 Thorsten Meyer and Steffen Krohnert 4 Ultrathin 3D FO-WLP eWLB-PoP (Embedded Wafer-Level Ball Grid Array-Package-on-Package) Technology 77 S.W. Yoon 5 NEPES’ Fan-Out Packaging Technology from Single die, SiP to Panel-Level Packaging 97 Jong Heon (Jay) Kim 6 M-Series Fan-Out with Adaptive Patterning 117 Tim Olson and Chris Scanlan 7 SWIFTR Semiconductor Packaging Technology 141 Ron Huemoeller and Curtis Zwenger 8 Embedded Silicon Fan-Out (eSiFOR) Technology for Wafer-Level System Integration 169 Daquan Yu 9 Embedding of Active and Passive Devices by Using an Embedded Interposer: The i2 Board Technology 185 Thomas Gottwald, Christian Roessle, and Alexander Neumann 10 Embedding of Power Electronic Components: The Smart p2 Pack Technology 201 Thomas Gottwald and Christian Roessle 11 Embedded Die in Substrate (Panel-Level) Packaging Technology 217 Tomoko Takahashi and Akio Katsumata 12 Blade: A Chip-First Embedded Technology for Power Packaging 241 Boris Plikat and Thorsten Scharf 13 The Role of Liquid Molding Compounds in the Success of Fan-Out Wafer-Level Packaging Technology 261 Katsushi Kan, Michiyasu Sugahara, and Markus Cichon 14 Advanced Dielectric Materials (Polyimides and Polybenzoxazoles) for Fan-Out Wafer-Level Packaging (FO-WLP) 271 T. Enomoto, J.I. Matthews, and T. Motobe 15 Enabling Low Temperature Cure Dielectrics for Advanced Wafer-Level Packaging 317 Stefan Vanclooster and Dimitri Janssen 16 The Role of Pick and Place in Fan-Out Wafer-Level Packaging 347 Hugo Pristauz, Alastair Attard, and Harald Meixner 17 Process and Equipment for eWLB: Chip Embedding by Molding 371 Edward Furgut, Hirohito Oshimori, and Hiroaki Yamagishi 18 Tools for Fan-Out Wafer-Level Package Processing 403 Nelson Fan, Eric Kuah, Eric Ng, and Otto Cheung 19 Equipment and Process for eWLB: Required PVD/Sputter Solutions 419 Chris Jones, Ricardo Gaio, and Jose Castro 20 Excimer Laser Ablation for the Patterning of Ultra-fine Routings 441 Habib Hichri, Markus Arendt, and Seongkuk Lee 21 Temporary Carrier Technologies for eWLB and RDL-First Fan-Out Wafer-Level Packages 457 Thomas Uhrmann and Boris Považay 22 Encapsulated Wafer-Level Package Technology (eWLCSP): Robust WLCSP Reliability with Sidewall Protection 471 S.W. Yoon 23 Embedded Multi-die Interconnect Bridge (EMIB): A Localized, High Density, High Bandwidth Packaging Interconnect 487 Ravi Mahajan, Robert Sankman, Kemal Aygun, Zhiguo Qian, Ashish Dhall, Jonathan Rosch, Debendra Mallik, and Islam Salama 24 Interconnection Technology Innovations in 2.5D Integrated Electronic Systems 501 Paragkumar A. Thadesar, Paul K. Jo, and Muhannad S. Bakir References 515 Index 521


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Product Details
  • ISBN-13: 9781119314134
  • Publisher: John Wiley & Sons Inc
  • Publisher Imprint: Wiley-IEEE Press
  • Height: 234 mm
  • No of Pages: 576
  • Series Title: IEEE Press
  • Weight: 1021 gr
  • ISBN-10: 1119314135
  • Publisher Date: 29 Mar 2019
  • Binding: Hardback
  • Language: English
  • Returnable: N
  • Spine Width: 33 mm
  • Width: 158 mm


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