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Alain C. Diebold

Alain C. Diebold

8 results found
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1.
Frontiers of Characterization and Metrology for Nanoelectronics
Frontiers of Characterization and Metrology for Nanoelectronics
By: David G. Seiler, Alain C. Diebold, Erik M. Secula, Rajinder P. Khosla, Robert McDonald
Publisher: American Institute of Physics
No Review Yet
₹5,474
Binding:
Hardback
Release:
26 Oct 2009
Language:
English
Available
Ships within 4-6 Days Explain..
2.
Handbook of Silicon Semiconductor MetrologyNR
Handbook of Silicon Semiconductor Metrology
By: Alain C. Diebold
Publisher: Taylor & Francis Ltd
No Review Yet
₹8,330
Binding:
Paperback
Release:
17 Oct 2019
Language:
English
International Edition
Ships within 14-16 Days Explain..
Free Shipping in India and low cost Worldwide.
3.
Handbook of Silicon Semiconductor Metrology1 % NR
Handbook of Silicon Semiconductor Metrology
By: Alain C. Diebold
Publisher: Taylor & Francis Inc
No Review Yet
₹41,825
₹41,407
Binding:
Hardback
Release:
29 Jun 2001
Language:
English
International Edition
Ships within 14-16 Days Explain..
Free Shipping in India and low cost Worldwide.
4.
Characterization and Metrology for Ulsi Technology 200533 %
Characterization and Metrology for Ulsi Technology 2005
By: David G. Seiler, Alain C. Diebold, Stefan Zollner, Erik M. Secula, Rajinder P. Khosla
Publisher: American Institute of Physics
No Review Yet
₹26,347
₹17,652
Binding:
Hardback
Release:
01 Sep 2005
Language:
English
Out of Stock
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5.
Characterization and Metrology for ULSI Technology 2003NR
Characterization and Metrology for ULSI Technology 2003
By: David G. Seiler, Alain C. Diebold, Thomas J. Shaffner, Stefan Zollner, Rajinder P. Khosla
Publisher: American Institute of Physics
No Review Yet
₹18,805
Binding:
Hardback
Release:
08 Oct 2003
Language:
English
Out of Stock
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6.
Frontiers of Characterization and Metrology for NanoelectronicsNR
Frontiers of Characterization and Metrology for Nanoelectronics
By: David G. Seiler, Alain C. Diebold, Erik M. Secula, Rajinder P. Khosla, Robert McDonald
Publisher: American Institute of Physics
No Review Yet
₹15,975
Binding:
SA
Release:
01 Sep 2007
Language:
English
Out of Stock
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7.
Frontiers of Characterization and Metrology for NanoelectronicsNR
Frontiers of Characterization and Metrology for Nanoelectronics
By: David G. Seiler, Alain C. Diebold, Erik M. Secula, Amal Chabli, Robert McDonald
Publisher: American Institute of Physics
No Review Yet
₹16,603
Binding:
SA
Release:
26 Apr 2012
Language:
English
Out of Stock
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8.
Characterization and Metrology for ULSI Technology 2000NR
Characterization and Metrology for ULSI Technology 2000
By: Patrick J. Smith, David G. Seiler, Alain C. Diebold, Thomas J. Shaffner, W. Murray Bullis
Publisher: American Institute of Physics
No Review Yet
₹16,609
Binding:
SA
Release:
01 Mar 2001
Language:
English
Out of Stock
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