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Rajinder P. Khosla

Rajinder P. Khosla

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1.
Frontiers of Characterization and Metrology for Nanoelectronics
Frontiers of Characterization and Metrology for Nanoelectronics
By: David G. Seiler, Alain C. Diebold, Erik M. Secula, Rajinder P. Khosla, Robert McDonald
Publisher: American Institute of Physics
No Review Yet
₹5,474
Binding:
Hardback
Release:
26 Oct 2009
Language:
English
Available
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2.
Frontiers of Characterization and Metrology for Nanoelectronics
Frontiers of Characterization and Metrology for Nanoelectronics
By: David G. Seiler, Alain C. Diebold, Erik M. Secula, Rajinder P. Khosla, Robert McDonald
Publisher: American Institute of Physics
No Review Yet
₹13,526
Binding:
SA
Release:
01 Sep 2007
Language:
English
Out of Stock
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3.
Characterization and Metrology for ULSI Technology 2003
Characterization and Metrology for ULSI Technology 2003
By: David G. Seiler, Alain C. Diebold, Thomas J. Shaffner, Stefan Zollner, Rajinder P. Khosla
Publisher: American Institute of Physics
No Review Yet
₹13,953
Binding:
Hardback
Release:
08 Oct 2003
Language:
English
Out of Stock
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4.
Characterization and Metrology for Ulsi Technology 200533 %
Characterization and Metrology for Ulsi Technology 2005
By: David G. Seiler, Alain C. Diebold, Stefan Zollner, Erik M. Secula, Rajinder P. Khosla
Publisher: American Institute of Physics
No Review Yet
₹26,347
₹17,652
Binding:
Hardback
Release:
01 Sep 2005
Language:
English
Out of Stock
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