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David G. Seiler

David G. Seiler

19 results found
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1.
Characterization and Metrology for ULSI Technology: 1998 International Conference, 23-27 March 199842 %
Characterization and Metrology for ULSI Technology: 1998 International Conference, 23-27 March 1998
By: David G. Seiler, R. McDonald, A.C. Diebold, E.J. Walters, T. J. Shaffner
Publisher: American Institute of Physics
No Review Yet
₹36,366
₹21,092
Binding:
SA
Release:
14 Dec 1998
Language:
English
Available
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2.
Metrology and Diagnostic Techniques for Nanoelectronics42 %
Metrology and Diagnostic Techniques for Nanoelectronics
By: David G. Seiler, Zhiyong Ma
Publisher: Pan Stanford Publishing Pte Ltd
No Review Yet
₹44,220
₹25,648
Binding:
Hardback
Release:
03 Oct 2016
Language:
English
Available
Ships within 2-4 Days Explain..
3.
Spectroscopy of Semiconductors
Spectroscopy of Semiconductors
By: David G Seiler, Albert C Beer, Robert K Willardson
Publisher: Academic Press
No Review Yet
₹0
Binding:
Digital (delivered electronically)
Release:
01 Jan 1992
Out of Stock
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4.
Spectroscopy of Semiconductors, The. Semiconductors and Semimetals
Spectroscopy of Semiconductors, The. Semiconductors and Semimetals
By: David G Seiler, Albert C Beer, Eicke R Weber, Robert K Willardson
Publisher: Elsevier Science & Technology
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₹0
Binding:
Digital (delivered electronically)
Release:
07 Jul 1992
Out of Stock
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5.
Metrology and Diagnostic Techniques for Nanoelectronics
Metrology and Diagnostic Techniques for Nanoelectronics
By: David G. Seiler, Zhiyong Ma
Publisher: Pan Stanford Publishing Pte Ltd
No Review Yet
₹33,904
Binding:
Digital (delivered electronically)
Release:
23 Nov 2016
Language:
English
Out of Stock
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6.
Characterization and Metrology for Ulsi Technology 200533 %
Characterization and Metrology for Ulsi Technology 2005
By: David G. Seiler, Alain C. Diebold, Stefan Zollner, Erik M. Secula, Rajinder P. Khosla
Publisher: American Institute of Physics
No Review Yet
₹26,347
₹17,652
Binding:
Hardback
Release:
01 Sep 2005
Language:
English
Out of Stock
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7.
Characterization and Metrology for ULSI Technology 2003
Characterization and Metrology for ULSI Technology 2003
By: David G. Seiler, Alain C. Diebold, Thomas J. Shaffner, Stefan Zollner, Rajinder P. Khosla
Publisher: American Institute of Physics
No Review Yet
₹13,953
Binding:
Hardback
Release:
08 Oct 2003
Language:
English
Out of Stock
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8.
Hgcdte Detector Reliability Study for the Goes Program (Classic Reprint)
Hgcdte Detector Reliability Study for the Goes Program (Classic Reprint)
By: David G. Seiler
Publisher: Forgotten Books
No Review Yet
₹2,195
Binding:
Hardback
Release:
04 Jan 2019
Language:
English
Out of Stock
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9.
Frontiers of Characterization and Metrology for Nanoelectronics
Frontiers of Characterization and Metrology for Nanoelectronics
By: David G. Seiler, Alain C. Diebold, Erik M. Secula, Rajinder P. Khosla, Robert McDonald
Publisher: American Institute of Physics
No Review Yet
₹13,526
Binding:
SA
Release:
01 Sep 2007
Language:
English
Out of Stock
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10.
Frontiers of Characterization and Metrology for Nanoelectronics
Frontiers of Characterization and Metrology for Nanoelectronics
By: David G. Seiler, Alain C. Diebold, Erik M. Secula, Amal Chabli, Robert McDonald
Publisher: American Institute of Physics
No Review Yet
₹13,689
Binding:
SA
Release:
26 Apr 2012
Language:
English
Out of Stock
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11.
Hgcdte Detector Reliability Study for the Goes Program (Classic Reprint)
Hgcdte Detector Reliability Study for the Goes Program (Classic Reprint)
By: David G. Seiler
Publisher: Forgotten Books
No Review Yet
₹890
Binding:
Paperback
Release:
04 Jan 2019
Language:
English
Out of Stock
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12.
Frontiers of Characterization and Metrology for Nanoelectronics
Frontiers of Characterization and Metrology for Nanoelectronics
By: David G. Seiler, Alain C. Diebold, Erik M. Secula, Rajinder P. Khosla, Robert McDonald
Publisher: American Institute of Physics
No Review Yet
₹5,683
Binding:
Hardback
Release:
26 Oct 2009
Language:
English
Out of Stock
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13.
Life on Hold
Life on Hold
By: Laurel Seiler Brunvoll, David G Seiler
Publisher: Multnomah Press
No Review Yet
₹813
Binding:
Paperback
Release:
27 Mar 2001
Language:
English
Out of Stock
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14.
Semiconductors and Semimetals47 %
Semiconductors and Semimetals
By: Albert C. Beer, David G. Seiler, Robert K. Willardson, C.L. Littler, Eicke R. Weber (University of California at Berkeley, USA)
Publisher: Elsevier Science Publishing Co Inc
No Review Yet
₹19,103
₹10,125
Binding:
Hardback
Release:
07 Jul 1992
Language:
English
Out of Stock
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15.
Physics and Chemistry of Mercury Cadmium Telluride and Novel IR Detector MaterialsNR
Physics and Chemistry of Mercury Cadmium Telluride and Novel IR Detector Materials
By: David G. Seiler
Publisher: American Institute of Physics
No Review Yet
₹8,582
Binding:
Hardback
Release:
15 Apr 1998
Language:
English
Out of Stock
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16.
Characterization and Metrology for ULSI Technology 2000NR
Characterization and Metrology for ULSI Technology 2000
By: Patrick J. Smith, David G. Seiler, Alain C. Diebold, Thomas J. Shaffner, W. Murray Bullis
Publisher: American Institute of Physics
No Review Yet
₹16,609
Binding:
SA
Release:
01 Mar 2001
Language:
English
Out of Stock
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