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Robert M. Seiler

Robert M. SeilerRobert M. Seiler, University of Calgary

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1.
Frontiers of Characterization and Metrology for Nanoelectronics
Frontiers of Characterization and Metrology for Nanoelectronics
By: David G. Seiler, Alain C. Diebold, Erik M. Secula, Rajinder P. Khosla, Robert McDonald
Publisher: American Institute of Physics
No Review Yet
₹5,421
Binding:
Hardback
Release:
26 Oct 2009
Language:
English
Available
Ships within 4-6 Days Explain..
2.
The Book Beautiful21 % POD/NR
The Book Beautiful
By: Robert M. Seiler
Publisher: Bloomsbury Publishing PLC
No Review Yet
₹16,910
₹13,359
Binding:
Hardback
Release:
07 Nov 2013
Language:
English
International Edition
Ships within 12-14 Days Explain..
Free Shipping in India and low cost Worldwide.
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
3.
Reel TimeNR
Reel Time
By: Robert M. Seiler, Tamara P. Seiler
Publisher: Au Press
No Review Yet
₹3,022
Binding:
Paperback
Release:
01 Dec 2012
Language:
English
Out of Stock
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4.
Frontiers of Characterization and Metrology for NanoelectronicsNR
Frontiers of Characterization and Metrology for Nanoelectronics
By: David G. Seiler, Alain C. Diebold, Erik M. Secula, Rajinder P. Khosla, Robert McDonald
Publisher: American Institute of Physics
No Review Yet
₹15,975
Binding:
SA
Release:
01 Sep 2007
Language:
English
Out of Stock
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5.
Frontiers of Characterization and Metrology for NanoelectronicsNR
Frontiers of Characterization and Metrology for Nanoelectronics
By: David G. Seiler, Alain C. Diebold, Erik M. Secula, Amal Chabli, Robert McDonald
Publisher: American Institute of Physics
No Review Yet
₹16,603
Binding:
SA
Release:
26 Apr 2012
Language:
English
Out of Stock
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