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Alain Diebold

Alain Diebold

15 results found
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1.
Handbook of Silicon Semiconductor Metrology24 %
Handbook of Silicon Semiconductor Metrology
By: Alain C. Diebold
Publisher: Taylor & Francis Ltd
No Review Yet
₹8,977
₹6,823
Binding:
Paperback
Release:
17 Oct 2019
Language:
English
Available
Ships within 14-16 Days Explain..
2.
Optical and Electrical Properties of Nanoscale Materials37 %
Optical and Electrical Properties of Nanoscale Materials
By: Alain Diebold, Tino Hofmann
Publisher: Springer Nature Switzerland AG
No Review Yet
₹19,039
₹11,995
Binding:
Paperback
Release:
12 Jan 2023
Language:
English
Available
Ships within 14-16 Days Explain..
3.
Optical and Electrical Properties of Nanoscale Materials37 %
Optical and Electrical Properties of Nanoscale Materials
By: Alain Diebold, Tino Hofmann
Publisher: Springer Nature Switzerland AG
No Review Yet
₹19,039
₹11,995
Binding:
Hardback
Release:
11 Jan 2022
Language:
English
Available
Ships within 14-16 Days Explain..
4.
Frontiers of Characterization and Metrology for Nanoelectronics
Frontiers of Characterization and Metrology for Nanoelectronics
By: David G. Seiler, Alain C. Diebold, Erik M. Secula, Rajinder P. Khosla, Robert McDonald
Publisher: American Institute of Physics
No Review Yet
₹5,474
Binding:
Hardback
Release:
26 Oct 2009
Language:
English
Available
Ships within 4-6 Days Explain..
5.
Handbook of Silicon Semiconductor Metrology2 % POD/NR
Handbook of Silicon Semiconductor Metrology
By: Alain C. Diebold
Publisher: Taylor & Francis Inc
No Review Yet
₹46,805
₹45,869
Binding:
Hardback
Release:
29 Jun 2001
Language:
English
International Edition
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Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
6.
Handbook of Silicon Semiconductor Metrology
Handbook of Silicon Semiconductor Metrology
By: Alain C. Diebold
Publisher: Taylor & Francis Ltd
No Review Yet
₹26,136
Binding:
Digital (delivered electronically)
Release:
29 Jun 2001
Language:
English
Out of Stock
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7.
Handbook of Silicon Semiconductor Metrology
Handbook of Silicon Semiconductor Metrology
By: Alain C. Diebold
Publisher: Taylor & Francis Ltd
No Review Yet
₹26,136
Binding:
Digital (delivered electronically)
Release:
29 Jun 2001
Language:
English
Out of Stock
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8.
Characterization and Metrology for Ulsi Technology 200533 %
Characterization and Metrology for Ulsi Technology 2005
By: David G. Seiler, Alain C. Diebold, Stefan Zollner, Erik M. Secula, Rajinder P. Khosla
Publisher: American Institute of Physics
No Review Yet
₹26,347
₹17,652
Binding:
Hardback
Release:
01 Sep 2005
Language:
English
Out of Stock
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9.
Frontiers of Characterization and Metrology for Nanoelectronics
Frontiers of Characterization and Metrology for Nanoelectronics
By: David G. Seiler, Alain C. Diebold, Erik M. Secula, Amal Chabli, Robert McDonald
Publisher: American Institute of Physics
No Review Yet
₹13,689
Binding:
SA
Release:
26 Apr 2012
Language:
English
Out of Stock
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10.
Characterization and Metrology for ULSI Technology 2003
Characterization and Metrology for ULSI Technology 2003
By: David G. Seiler, Alain C. Diebold, Thomas J. Shaffner, Stefan Zollner, Rajinder P. Khosla
Publisher: American Institute of Physics
No Review Yet
₹13,953
Binding:
Hardback
Release:
08 Oct 2003
Language:
English
Out of Stock
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11.
Frontiers of Characterization and Metrology for Nanoelectronics
Frontiers of Characterization and Metrology for Nanoelectronics
By: David G. Seiler, Alain C. Diebold, Erik M. Secula, Rajinder P. Khosla, Robert McDonald
Publisher: American Institute of Physics
No Review Yet
₹13,526
Binding:
SA
Release:
01 Sep 2007
Language:
English
Out of Stock
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12.
Optical and Electrical Properties of Nanoscale MaterialsNR
Optical and Electrical Properties of Nanoscale Materials
By: Hofmann Tino Hofmann, Diebold Alain Diebold
Publisher: Springer Nature B.V.
No Review Yet
₹4,323
Binding:
Paperback
Release:
12 Jan 2022
Language:
English
Out of Stock
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13.
Characterization and Metrology for ULSI Technology 2000NR
Characterization and Metrology for ULSI Technology 2000
By: Patrick J. Smith, David G. Seiler, Alain C. Diebold, Thomas J. Shaffner, W. Murray Bullis
Publisher: American Institute of Physics
No Review Yet
₹16,609
Binding:
SA
Release:
01 Mar 2001
Language:
English
Out of Stock
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