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David Diebold

David Diebold

11 results found
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1.
Frontiers of Characterization and Metrology for Nanoelectronics
Frontiers of Characterization and Metrology for Nanoelectronics
By: David G. Seiler, Alain C. Diebold, Erik M. Secula, Rajinder P. Khosla, Robert McDonald
Publisher: American Institute of Physics
No Review Yet
₹5,474
Binding:
Hardback
Release:
26 Oct 2009
Language:
English
Available
Ships within 4-6 Days Explain..
2.
Characterization and Metrology for ULSI Technology: 1998 International Conference, 23-27 March 199843 %
Characterization and Metrology for ULSI Technology: 1998 International Conference, 23-27 March 1998
By: David G. Seiler, R. McDonald, A.C. Diebold, E.J. Walters, T. J. Shaffner
Publisher: American Institute of Physics
No Review Yet
₹34,612
₹19,729
Binding:
SA
Release:
14 Dec 1998
Language:
English
Available
Ships within 1-2 Days Explain..
3.
This Is How We Dance
This Is How We Dance
By: David Diebold
Publisher: Monument Media Ltd
No Review Yet
₹1,133
Binding:
Paperback
Release:
31 Dec 2019
Out of Stock
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4.
Characterization and Metrology for Ulsi Technology 200533 %
Characterization and Metrology for Ulsi Technology 2005
By: David G. Seiler, Alain C. Diebold, Stefan Zollner, Erik M. Secula, Rajinder P. Khosla
Publisher: American Institute of Physics
No Review Yet
₹26,347
₹17,652
Binding:
Hardback
Release:
01 Sep 2005
Language:
English
Out of Stock
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5.
Frontiers of Characterization and Metrology for Nanoelectronics
Frontiers of Characterization and Metrology for Nanoelectronics
By: David G. Seiler, Alain C. Diebold, Erik M. Secula, Amal Chabli, Robert McDonald
Publisher: American Institute of Physics
No Review Yet
₹13,689
Binding:
SA
Release:
26 Apr 2012
Language:
English
Out of Stock
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6.
Characterization and Metrology for ULSI Technology 2003
Characterization and Metrology for ULSI Technology 2003
By: David G. Seiler, Alain C. Diebold, Thomas J. Shaffner, Stefan Zollner, Rajinder P. Khosla
Publisher: American Institute of Physics
No Review Yet
₹13,953
Binding:
Hardback
Release:
08 Oct 2003
Language:
English
Out of Stock
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7.
Frontiers of Characterization and Metrology for Nanoelectronics
Frontiers of Characterization and Metrology for Nanoelectronics
By: David G. Seiler, Alain C. Diebold, Erik M. Secula, Rajinder P. Khosla, Robert McDonald
Publisher: American Institute of Physics
No Review Yet
₹13,526
Binding:
SA
Release:
01 Sep 2007
Language:
English
Out of Stock
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8.
Diebold Schillings Beschreibung Der Burgundischen Kriegen1 % POD/NR
Diebold Schillings Beschreibung Der Burgundischen Kriegen
By: David Herrliberger, Diebold Schilling (Bourgeois De Berne)
Publisher: Nabu Press
No Review Yet
₹1,994
₹1,974
Binding:
Paperback
Release:
22 Nov 2011
Language:
English
Out of Stock
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Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
9.
Diebold Schillings Beschreibung Der Burgundischen Kriegen1 % POD/NR
Diebold Schillings Beschreibung Der Burgundischen Kriegen
By: David Herrliberger, Diebold Schilling (Bourgeois De Berne)
Publisher: Nabu Press
No Review Yet
₹1,994
₹1,974
Binding:
Paperback
Release:
08 Jan 2014
Language:
English
Out of Stock
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Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
10.
Diebold Schillings Beschreibung Der Burgundischen Kriegen1 % POD/NR
Diebold Schillings Beschreibung Der Burgundischen Kriegen
By: David Herrliberger, Diebold Schilling (Bourgeois De Berne)
Publisher: Nabu Press
No Review Yet
₹1,994
₹1,974
Binding:
Paperback
Release:
01 Nov 2011
Language:
English
Out of Stock
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Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
11.
Characterization and Metrology for ULSI Technology 2000NR
Characterization and Metrology for ULSI Technology 2000
By: Patrick J. Smith, David G. Seiler, Alain C. Diebold, Thomas J. Shaffner, W. Murray Bullis
Publisher: American Institute of Physics
No Review Yet
₹16,609
Binding:
SA
Release:
01 Mar 2001
Language:
English
Out of Stock
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