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Diebold C. Diebold

Diebold C. Diebold

15 results found
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1.
Pigments, Extenders, and Particles in Surface Coatings and Plastics37 %
Pigments, Extenders, and Particles in Surface Coatings and Plastics
By: Brett R Hester, Frank A C Vanhecke, Michael Diebold, Philipp M Niedenzu, Steven de Backer
Publisher: Springer International Publishing
No Review Yet
₹10,787
₹6,796
Binding:
Paperback
Release:
20 Nov 2023
Language:
English
Available
Ships within 12-14 Days Explain..
2.
Pigments, Extenders, and Particles in Surface Coatings and Plastics37 %
Pigments, Extenders, and Particles in Surface Coatings and Plastics
By: Brett R Hester, Frank A C Vanhecke, Michael Diebold, Philipp M Niedenzu, Steven de Backer
Publisher: Springer International Publishing
No Review Yet
₹15,008
₹9,455
Binding:
Hardback
Release:
06 Nov 2022
Language:
English
Available
Ships within 12-14 Days Explain..
3.
Histopathology of Nodal and Extranodal Non-Hodgkin's Lymphomas59 %
Histopathology of Nodal and Extranodal Non-Hodgkin's Lymphomas
By: A. C. Feller, Alfred C. Feller, Jacques Diebold, M. Paulli, Alfred C Feller
Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
No Review Yet
₹23,282
₹9,546
Binding:
Hardback
Release:
20 Nov 2003
Language:
English
Available
Ships within 2-4 Days Explain..
4.
Histopathology of Nodal and Extranodal Non-Hodgkin's Lymphomas32 %
Histopathology of Nodal and Extranodal Non-Hodgkin's Lymphomas
By: M. C. Paulli, Alfred C. Feller, Jacques Diebold, Alfred C Feller, A Le Tourneau
Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
No Review Yet
₹10,318
₹7,016
Binding:
Paperback
Release:
19 Aug 2012
Language:
English
Available
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5.
Frontiers of Characterization and Metrology for Nanoelectronics
Frontiers of Characterization and Metrology for Nanoelectronics
By: Robert McDonald, David G Seiler, Alain C Diebold, C Michael Garner, Dan Herr
Publisher: American Institute of Physics
No Review Yet
₹5,474
Binding:
SF
Release:
26 Oct 2009
Language:
English
Available
Ships within 4-6 Days Explain..
6.
Handbook of Silicon Semiconductor MetrologyPOD/NR
Handbook of Silicon Semiconductor Metrology
By: Alain C. Diebold, Alain C. (Sematech, Austin, Texas, USA) Diebold, Alain C Diebold
Publisher: Taylor and Francis
No Review Yet
₹6,935
Binding:
Paperback
Release:
17 Oct 2019
Language:
English
International Edition
Ships within 18-20 Days Explain..
Free Shipping in India and low cost Worldwide.
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
7.
Handbook of Silicon Semiconductor MetrologyNR
Handbook of Silicon Semiconductor Metrology
By: Alain C. Diebold, Diebold C. Diebold, Alain C. (Sematech, Austin, Texas, USA) Diebold
Publisher: Taylor & Francis Inc
No Review Yet
₹33,554
Binding:
Hardback
Release:
29 Jun 2001
Language:
English
International Edition
Ships within 18-20 Days Explain..
Free Shipping in India and low cost Worldwide.
8.
Fast Pyrolysis of Biomass38 % POD/NR
Fast Pyrolysis of Biomass
By: S. Czernik, J. Diebold, A. Oasmaa, C. Peacocke, A. V. Bridgwater
Publisher: Cpl Press
No Review Yet
₹6,720
₹4,166
Binding:
Hardback
Release:
14 Apr 2008
Language:
English
International Edition
Ships within 14-16 Days Explain..
Free Shipping in India and low cost Worldwide.
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
9.
Characterization and Metrology for ULSI Technology38 %
Characterization and Metrology for ULSI Technology
By: Robert McDonald, W Murray Bullis, E Jane Walters, David G Seiler, Alain C Diebold
Publisher: American Institute of Physics
No Review Yet
₹13,650
₹8,463
Binding:
SF
Release:
14 Dec 1998
Language:
English
Out of Stock
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10.
Characterization and Metrology for ULSI Technology 200533 %
Characterization and Metrology for ULSI Technology 2005
By: Stefan Zollner, Robert McDonald, David G Seiler, D G Seiler, Alain C Diebold
Publisher: Springer
No Review Yet
₹26,347
₹17,652
Binding:
Hardback
Release:
01 Sep 2005
Language:
English
Out of Stock
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11.
Irrigation Trials in the Southwest Region (Classic Reprint)NR
Irrigation Trials in the Southwest Region (Classic Reprint)
By: C H Diebold
Publisher: Forgotten Books
No Review Yet
₹985
Release:
09 Sep 2018
Out of Stock
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12.
Irrigation Trials in the Southwest Region (Classic Reprint)NR
Irrigation Trials in the Southwest Region (Classic Reprint)
By: C H Diebold
Publisher: Forgotten Books
No Review Yet
₹2,597
Release:
09 Sep 2018
Out of Stock
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13.
Frontiers of Characterization and Metrology for Nanoelectronics: 2011NR
Frontiers of Characterization and Metrology for Nanoelectronics: 2011
By: Amal Chabli, Robert McDonald, David G Seiler, Alain C Diebold, Erik M Secula
Publisher: American Institute of Physics
No Review Yet
₹16,603
Binding:
Book
Release:
26 Apr 2012
Language:
English
Out of Stock
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14.
Characterization and Metrology for ULSI TechnologyNR
Characterization and Metrology for ULSI Technology
By: Stefan Zollner, Robert McDonald, David G Seiler, Alain C Diebold, Eric M Secula
Publisher: American Institute of Physics
No Review Yet
₹18,805
Binding:
SF
Release:
08 Oct 2003
Language:
English
Out of Stock
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15.
Frontiers of Characterization and Metrology for NanoelectronicsNR
Frontiers of Characterization and Metrology for Nanoelectronics
By: Robert McDonald, David G Seiler, Alain C Diebold, C Michael Garner, Dan Herr
Publisher: American Institute of Physics
No Review Yet
₹15,975
Binding:
SF
Release:
01 Sep 2007
Language:
English
Out of Stock
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