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Diebold C. Diebold

Diebold C. Diebold

19 results found
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1.
Pigments, Extenders, and Particles in Surface Coatings and Plastics37 %
Pigments, Extenders, and Particles in Surface Coatings and Plastics
By: Michael Diebold, Steven de Backer, Brett R. Hester, Frank A. C. Vanhecke, Philipp M. Niedenzu
Publisher: Springer Nature Switzerland AG
No Review Yet
₹12,592
₹7,933
Binding:
Paperback
Release:
07 Nov 2023
Language:
English
Available
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2.
Pigments, Extenders, and Particles in Surface Coatings and Plastics37 %
Pigments, Extenders, and Particles in Surface Coatings and Plastics
By: Michael Diebold, Steven de Backer, Brett R. Hester, Frank A. C. Vanhecke, Philipp M. Niedenzu
Publisher: Springer Nature Switzerland AG
No Review Yet
₹17,519
₹11,037
Binding:
Hardback
Release:
06 Nov 2022
Language:
English
Available
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3.
Handbook of Silicon Semiconductor Metrology23 %
Handbook of Silicon Semiconductor Metrology
By: Alain C. Diebold
Publisher: Taylor & Francis Ltd
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₹8,051
₹6,199
Binding:
Paperback
Release:
17 Oct 2019
Language:
English
Available
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4.
Histopathology of Nodal and Extranodal Non-Hodgkin’s Lymphomas21 %
Histopathology of Nodal and Extranodal Non-Hodgkin’s Lymphomas
By: Alfred C. Feller, Jacques Diebold, A. le Tourneau, M. Paulli
Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
No Review Yet
₹12,044
₹9,515
Binding:
Paperback
Release:
19 Aug 2012
Language:
English
Available
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5.
Histopathology of Nodal and Extranodal Non-Hodgkin’s Lymphomas
Histopathology of Nodal and Extranodal Non-Hodgkin’s Lymphomas
By: Alfred C. Feller, Jacques Diebold, A. le Tourneau, M. Paulli
Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
No Review Yet
₹7,373
Binding:
Hardback
Release:
20 Nov 2003
Language:
English
Available
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6.
Frontiers of Characterization and Metrology for Nanoelectronics
Frontiers of Characterization and Metrology for Nanoelectronics
By: David G. Seiler, Alain C. Diebold, Erik M. Secula, Rajinder P. Khosla, Robert McDonald
Publisher: American Institute of Physics
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₹5,474
Binding:
Hardback
Release:
26 Oct 2009
Language:
English
Available
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7.
Characterization and Metrology for ULSI Technology: 1998 International Conference, 23-27 March 199843 %
Characterization and Metrology for ULSI Technology: 1998 International Conference, 23-27 March 1998
By: David G. Seiler, R. McDonald, A.C. Diebold, E.J. Walters, T. J. Shaffner
Publisher: American Institute of Physics
No Review Yet
₹34,931
₹19,911
Binding:
SA
Release:
14 Dec 1998
Language:
English
Available
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8.
Handbook of Silicon Semiconductor MetrologyPOD/NR
Handbook of Silicon Semiconductor Metrology
By: Alain C. Diebold
Publisher: Taylor & Francis Inc
No Review Yet
₹42,817
Binding:
Hardback
Release:
29 Jun 2001
Language:
English
International Edition
Ships within 12-14 Days Explain..
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Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
9.
Fast Pyrolysis of Biomass33 % POD/NR
Fast Pyrolysis of Biomass
By: S. Czernik, J. Diebold, A. Oasmaa, C. Peacocke, A. V. Bridgwater
Publisher: Cpl Press
No Review Yet
₹7,240
₹4,851
Binding:
Hardback
Release:
14 Apr 2008
Language:
English
International Edition
Ships within 12-14 Days Explain..
Free Shipping in India and low cost Worldwide.
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
10.
Handbook of Silicon Semiconductor Metrology
Handbook of Silicon Semiconductor Metrology
By: Alain C. Diebold
Publisher: Taylor & Francis Ltd
No Review Yet
₹26,136
Binding:
Digital (delivered electronically)
Release:
29 Jun 2001
Language:
English
Out of Stock
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11.
Handbook of Silicon Semiconductor Metrology
Handbook of Silicon Semiconductor Metrology
By: Alain C. Diebold
Publisher: Taylor & Francis Ltd
No Review Yet
₹26,136
Binding:
Digital (delivered electronically)
Release:
29 Jun 2001
Language:
English
Out of Stock
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12.
Characterization and Metrology for ULSI Technology 2003
Characterization and Metrology for ULSI Technology 2003
By: David G. Seiler, Alain C. Diebold, Thomas J. Shaffner, Stefan Zollner, Rajinder P. Khosla
Publisher: American Institute of Physics
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₹13,953
Binding:
Hardback
Release:
08 Oct 2003
Language:
English
Out of Stock
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13.
Characterization and Metrology for Ulsi Technology 200533 %
Characterization and Metrology for Ulsi Technology 2005
By: David G. Seiler, Alain C. Diebold, Stefan Zollner, Erik M. Secula, Rajinder P. Khosla
Publisher: American Institute of Physics
No Review Yet
₹26,347
₹17,652
Binding:
Hardback
Release:
01 Sep 2005
Language:
English
Out of Stock
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14.
Frontiers of Characterization and Metrology for Nanoelectronics
Frontiers of Characterization and Metrology for Nanoelectronics
By: David G. Seiler, Alain C. Diebold, Erik M. Secula, Rajinder P. Khosla, Robert McDonald
Publisher: American Institute of Physics
No Review Yet
₹13,526
Binding:
SA
Release:
01 Sep 2007
Language:
English
Out of Stock
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15.
Frontiers of Characterization and Metrology for Nanoelectronics
Frontiers of Characterization and Metrology for Nanoelectronics
By: David G. Seiler, Alain C. Diebold, Erik M. Secula, Amal Chabli, Robert McDonald
Publisher: American Institute of Physics
No Review Yet
₹13,689
Binding:
SA
Release:
26 Apr 2012
Language:
English
Out of Stock
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16.
Irrigation Trials in the Southwest Region (Classic Reprint)NR
Irrigation Trials in the Southwest Region (Classic Reprint)
By: C H Diebold
Publisher: Forgotten Books
No Review Yet
₹2,597
Binding:
Hardback
Release:
09 Sep 2018
Language:
English
Out of Stock
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17.
Characterization and Metrology for ULSI Technology 2000NR
Characterization and Metrology for ULSI Technology 2000
By: Patrick J. Smith, David G. Seiler, Alain C. Diebold, Thomas J. Shaffner, W. Murray Bullis
Publisher: American Institute of Physics
No Review Yet
₹16,609
Binding:
SA
Release:
01 Mar 2001
Language:
English
Out of Stock
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