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K Diebold

K Diebold

13 results found
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1.
Pigments, Extenders, and Particles in Surface Coatings and Plastics37 %
Pigments, Extenders, and Particles in Surface Coatings and Plastics
By: Brett R Hester, Frank A C Vanhecke, Michael Diebold, Philipp M Niedenzu, Steven de Backer
Publisher: Springer International Publishing
No Review Yet
₹10,787
₹6,796
Binding:
Paperback
Release:
20 Nov 2023
Language:
English
Available
Ships within 12-14 Days Explain..
2.
Pigments, Extenders, and Particles in Surface Coatings and Plastics37 %
Pigments, Extenders, and Particles in Surface Coatings and Plastics
By: Brett R Hester, Frank A C Vanhecke, Michael Diebold, Philipp M Niedenzu, Steven de Backer
Publisher: Springer International Publishing
No Review Yet
₹15,008
₹9,455
Binding:
Hardback
Release:
06 Nov 2022
Language:
English
Available
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3.
Die Erblichen Myoklonisch-Epileptisch-Dementiellen Kernsyndrome31 %
Die Erblichen Myoklonisch-Epileptisch-Dementiellen Kernsyndrome
By: K. Diebold, K Diebold
Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
No Review Yet
₹4,821
₹3,326
Binding:
Paperback
Release:
07 Jan 2012
Language:
German
Available
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4.
Histopathology of Nodal and Extranodal Non-Hodgkin's Lymphomas32 %
Histopathology of Nodal and Extranodal Non-Hodgkin's Lymphomas
By: M. C. Paulli, Alfred C. Feller, Jacques Diebold, Alfred C Feller, A Le Tourneau
Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
No Review Yet
₹10,318
₹7,016
Binding:
Paperback
Release:
19 Aug 2012
Language:
English
Available
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5.
Frontiers of Characterization and Metrology for Nanoelectronics
Frontiers of Characterization and Metrology for Nanoelectronics
By: Robert McDonald, David G Seiler, Alain C Diebold, C Michael Garner, Dan Herr
Publisher: American Institute of Physics
No Review Yet
₹5,474
Binding:
SF
Release:
26 Oct 2009
Language:
English
Available
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6.
Histopathology of Nodal and Extranodal Non-Hodgkin's Lymphomas59 %
Histopathology of Nodal and Extranodal Non-Hodgkin's Lymphomas
By: A. C. Feller, Alfred C. Feller, Jacques Diebold, M. Paulli, Alfred C Feller
Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
No Review Yet
₹23,282
₹9,546
Binding:
Hardback
Release:
20 Nov 2003
Language:
English
Available
Ships within 2-4 Days Explain..
7.
Characterization and Metrology for ULSI Technology 200533 %
Characterization and Metrology for ULSI Technology 2005
By: Stefan Zollner, Robert McDonald, David G Seiler, D G Seiler, Alain C Diebold
Publisher: Springer
No Review Yet
₹26,347
₹17,652
Binding:
Hardback
Release:
01 Sep 2005
Language:
English
Out of Stock
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8.
Characterization and Metrology for ULSI Technology38 %
Characterization and Metrology for ULSI Technology
By: Robert McDonald, W Murray Bullis, E Jane Walters, David G Seiler, Alain C Diebold
Publisher: American Institute of Physics
No Review Yet
₹13,650
₹8,463
Binding:
SF
Release:
14 Dec 1998
Language:
English
Out of Stock
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9.
Pigments, Extenders, and Particles in Surface Coatings and PlasticsNR
Pigments, Extenders, and Particles in Surface Coatings and Plastics
By: Backer Steven De Backer, Niedenzu Philipp M. Niedenzu, Diebold Michael Diebold
Publisher: Springer Nature B.V.
No Review Yet
₹4,297
Binding:
Paperback
Release:
06 Nov 2022
Language:
English
Out of Stock
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10.
Die Erblichen Myoklonisch-Epileptisch-Dementiellen Kernsyndrome: Progressive Myoklonusepilepsien - Dyssynergia Cerebellaris Myoclonica - Myoklonische Varianten Der Drei Nachinfantilen Formen Der Amaurotischen IdiotieNR
Die Erblichen Myoklonisch-Epileptisch-Dementiellen Kernsyndrome: Progressive Myoklonusepilepsien - Dyssynergia Cerebellaris Myoclonica - Myoklonische Varianten Der Drei Nachinfantilen Formen Der Amaurotischen Idiotie
By: K Diebold
Publisher: Springer
No Review Yet
₹5,330
Binding:
Hardback
Release:
08 Nov 2018
Language:
English
Out of Stock
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11.
Frontiers of Characterization and Metrology for NanoelectronicsNR
Frontiers of Characterization and Metrology for Nanoelectronics
By: Robert McDonald, David G Seiler, Alain C Diebold, C Michael Garner, Dan Herr
Publisher: American Institute of Physics
No Review Yet
₹15,975
Binding:
SF
Release:
01 Sep 2007
Language:
English
Out of Stock
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12.
Frontiers of Characterization and Metrology for Nanoelectronics: 2011NR
Frontiers of Characterization and Metrology for Nanoelectronics: 2011
By: Amal Chabli, Robert McDonald, David G Seiler, Alain C Diebold, Erik M Secula
Publisher: American Institute of Physics
No Review Yet
₹16,603
Binding:
Book
Release:
26 Apr 2012
Language:
English
Out of Stock
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13.
Characterization and Metrology for ULSI TechnologyNR
Characterization and Metrology for ULSI Technology
By: Stefan Zollner, Robert McDonald, David G Seiler, Alain C Diebold, Eric M Secula
Publisher: American Institute of Physics
No Review Yet
₹18,805
Binding:
SF
Release:
08 Oct 2003
Language:
English
Out of Stock
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