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K Diebold

K Diebold

13 results found
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1.
Pigments, Extenders, and Particles in Surface Coatings and Plastics37 %
Pigments, Extenders, and Particles in Surface Coatings and Plastics
By: Michael Diebold, Steven de Backer, Brett R. Hester, Frank A. C. Vanhecke, Philipp M. Niedenzu
Publisher: Springer Nature Switzerland AG
No Review Yet
₹12,739
₹8,026
Binding:
Paperback
Release:
07 Nov 2023
Language:
English
Available
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2.
Pigments, Extenders, and Particles in Surface Coatings and Plastics37 %
Pigments, Extenders, and Particles in Surface Coatings and Plastics
By: Michael Diebold, Steven de Backer, Brett R. Hester, Frank A. C. Vanhecke, Philipp M. Niedenzu
Publisher: Springer Nature Switzerland AG
No Review Yet
₹18,047
₹11,370
Binding:
Hardback
Release:
06 Nov 2022
Language:
English
Available
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3.
Die erblichen myoklonisch-epileptisch-dementiellen Kernsyndrome21 %
Die erblichen myoklonisch-epileptisch-dementiellen Kernsyndrome
By: K. Diebold
Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
No Review Yet
₹5,456
₹4,310
Binding:
Paperback
Release:
07 Jan 2012
Language:
German
Available
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4.
Frontiers of Characterization and Metrology for Nanoelectronics
Frontiers of Characterization and Metrology for Nanoelectronics
By: David G. Seiler, Alain C. Diebold, Erik M. Secula, Rajinder P. Khosla, Robert McDonald
Publisher: American Institute of Physics
No Review Yet
₹5,474
Binding:
Hardback
Release:
26 Oct 2009
Language:
English
Available
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5.
Histopathology of Nodal and Extranodal Non-Hodgkin’s Lymphomas
Histopathology of Nodal and Extranodal Non-Hodgkin’s Lymphomas
By: Alfred C. Feller, Jacques Diebold, A. le Tourneau, M. Paulli
Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
No Review Yet
₹8,576
Binding:
Hardback
Release:
20 Nov 2003
Language:
English
Available
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6.
Histopathology of Nodal and Extranodal Non-Hodgkin’s Lymphomas21 %
Histopathology of Nodal and Extranodal Non-Hodgkin’s Lymphomas
By: Alfred C. Feller, Jacques Diebold, A. le Tourneau, M. Paulli
Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
No Review Yet
₹11,677
₹9,225
Binding:
Paperback
Release:
19 Aug 2012
Language:
English
Available
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7.
Characterization and Metrology for Ulsi Technology 200533 %
Characterization and Metrology for Ulsi Technology 2005
By: David G. Seiler, Alain C. Diebold, Stefan Zollner, Erik M. Secula, Rajinder P. Khosla
Publisher: American Institute of Physics
No Review Yet
₹26,347
₹17,652
Binding:
Hardback
Release:
01 Sep 2005
Language:
English
Out of Stock
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8.
Pigments, Extenders, and Particles in Surface Coatings and PlasticsNR
Pigments, Extenders, and Particles in Surface Coatings and Plastics
By: Backer Steven De Backer, Niedenzu Philipp M. Niedenzu, Diebold Michael Diebold
Publisher: Springer Nature B.V.
No Review Yet
₹4,323
Binding:
Paperback
Release:
06 Nov 2022
Language:
English
Out of Stock
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9.
Die Erblichen Myoklonisch-Epileptisch-Dementiellen KernsyndromeNR
Die Erblichen Myoklonisch-Epileptisch-Dementiellen Kernsyndrome
By: K Diebold
Publisher: Springer
No Review Yet
₹5,330
Binding:
Hardback
Release:
27 Mar 1973
Language:
English
Out of Stock
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10.
Frontiers of Characterization and Metrology for NanoelectronicsNR
Frontiers of Characterization and Metrology for Nanoelectronics
By: David G. Seiler, Alain C. Diebold, Erik M. Secula, Amal Chabli, Robert McDonald
Publisher: American Institute of Physics
No Review Yet
₹16,603
Binding:
SA
Release:
26 Apr 2012
Language:
English
Out of Stock
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11.
Frontiers of Characterization and Metrology for NanoelectronicsNR
Frontiers of Characterization and Metrology for Nanoelectronics
By: David G. Seiler, Alain C. Diebold, Erik M. Secula, Rajinder P. Khosla, Robert McDonald
Publisher: American Institute of Physics
No Review Yet
₹15,975
Binding:
SA
Release:
01 Sep 2007
Language:
English
Out of Stock
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12.
Characterization and Metrology for ULSI Technology 2003NR
Characterization and Metrology for ULSI Technology 2003
By: David G. Seiler, Alain C. Diebold, Thomas J. Shaffner, Stefan Zollner, Rajinder P. Khosla
Publisher: American Institute of Physics
No Review Yet
₹18,805
Binding:
Hardback
Release:
08 Oct 2003
Language:
English
Out of Stock
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13.
Characterization and Metrology for ULSI Technology 2000NR
Characterization and Metrology for ULSI Technology 2000
By: Patrick J. Smith, David G. Seiler, Alain C. Diebold, Thomas J. Shaffner, W. Murray Bullis
Publisher: American Institute of Physics
No Review Yet
₹16,609
Binding:
SA
Release:
01 Mar 2001
Language:
English
Out of Stock
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