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K Diebold

K Diebold

14 results found
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1.
Pigments, Extenders, and Particles in Surface Coatings and Plastics37 % NR
Pigments, Extenders, and Particles in Surface Coatings and Plastics
By: Michael Diebold, Steven de Backer, Brett R. Hester, Frank A. C. Vanhecke, Philipp M. Niedenzu
Publisher: Springer Nature Switzerland AG
No Review Yet
₹12,879
₹8,114
Binding:
Paperback
Release:
07 Nov 2023
Language:
English
Available
Ships within 14-16 Days Explain..
2.
Pigments, Extenders, and Particles in Surface Coatings and Plastics37 % NR
Pigments, Extenders, and Particles in Surface Coatings and Plastics
By: Michael Diebold, Steven de Backer, Brett R. Hester, Frank A. C. Vanhecke, Philipp M. Niedenzu
Publisher: Springer Nature Switzerland AG
No Review Yet
₹17,919
₹11,289
Binding:
Hardback
Release:
06 Nov 2022
Language:
English
Available
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3.
Die erblichen myoklonisch-epileptisch-dementiellen Kernsyndrome21 %
Die erblichen myoklonisch-epileptisch-dementiellen Kernsyndrome
By: K. Diebold
Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
No Review Yet
₹5,756
₹4,547
Binding:
Paperback
Release:
07 Jan 2012
Language:
German
Available
Ships within 18-20 Days Explain..
4.
Frontiers of Characterization and Metrology for Nanoelectronics
Frontiers of Characterization and Metrology for Nanoelectronics
By: David G. Seiler, Alain C. Diebold, Erik M. Secula, Rajinder P. Khosla, Robert McDonald
Publisher: American Institute of Physics
No Review Yet
₹5,474
Binding:
Hardback
Release:
26 Oct 2009
Language:
English
Available
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5.
Characterization and Metrology for ULSI Technology: 1998 International Conference, 23-27 March 199843 %
Characterization and Metrology for ULSI Technology: 1998 International Conference, 23-27 March 1998
By: David G. Seiler, R. McDonald, A.C. Diebold, E.J. Walters, T. J. Shaffner
Publisher: American Institute of Physics
No Review Yet
₹35,728
₹20,365
Binding:
SA
Release:
14 Dec 1998
Language:
English
Available
Ships within 1-2 Days Explain..
6.
Histopathology of Nodal and Extranodal Non-Hodgkin’s Lymphomas
Histopathology of Nodal and Extranodal Non-Hodgkin’s Lymphomas
By: Alfred C. Feller, Jacques Diebold, A. le Tourneau, M. Paulli
Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
No Review Yet
₹7,507
Binding:
Hardback
Release:
20 Nov 2003
Language:
English
Available
Ships within 8-10 Days Explain..
7.
Histopathology of Nodal and Extranodal Non-Hodgkin’s Lymphomas21 %
Histopathology of Nodal and Extranodal Non-Hodgkin’s Lymphomas
By: Alfred C. Feller, Jacques Diebold, A. le Tourneau, M. Paulli
Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
No Review Yet
₹12,319
₹9,732
Binding:
Paperback
Release:
19 Aug 2012
Language:
English
Available
Ships within 18-20 Days Explain..
8.
Frontiers of Characterization and Metrology for Nanoelectronics
Frontiers of Characterization and Metrology for Nanoelectronics
By: David G. Seiler, Alain C. Diebold, Erik M. Secula, Rajinder P. Khosla, Robert McDonald
Publisher: American Institute of Physics
No Review Yet
₹13,526
Binding:
SA
Release:
01 Sep 2007
Language:
English
Out of Stock
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9.
Frontiers of Characterization and Metrology for Nanoelectronics
Frontiers of Characterization and Metrology for Nanoelectronics
By: David G. Seiler, Alain C. Diebold, Erik M. Secula, Amal Chabli, Robert McDonald
Publisher: American Institute of Physics
No Review Yet
₹13,689
Binding:
SA
Release:
26 Apr 2012
Language:
English
Out of Stock
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10.
Characterization and Metrology for Ulsi Technology 200533 %
Characterization and Metrology for Ulsi Technology 2005
By: David G. Seiler, Alain C. Diebold, Stefan Zollner, Erik M. Secula, Rajinder P. Khosla
Publisher: American Institute of Physics
No Review Yet
₹26,347
₹17,652
Binding:
Hardback
Release:
01 Sep 2005
Language:
English
Out of Stock
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11.
Characterization and Metrology for ULSI Technology 2003
Characterization and Metrology for ULSI Technology 2003
By: David G. Seiler, Alain C. Diebold, Thomas J. Shaffner, Stefan Zollner, Rajinder P. Khosla
Publisher: American Institute of Physics
No Review Yet
₹13,953
Binding:
Hardback
Release:
08 Oct 2003
Language:
English
Out of Stock
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12.
Pigments, Extenders, and Particles in Surface Coatings and PlasticsNR
Pigments, Extenders, and Particles in Surface Coatings and Plastics
By: Backer Steven De Backer, Niedenzu Philipp M. Niedenzu, Diebold Michael Diebold
Publisher: Springer Nature B.V.
No Review Yet
₹4,323
Binding:
Paperback
Release:
06 Nov 2022
Language:
English
Out of Stock
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13.
Die Erblichen Myoklonisch-Epileptisch-Dementiellen KernsyndromeNR
Die Erblichen Myoklonisch-Epileptisch-Dementiellen Kernsyndrome
By: K Diebold
Publisher: Springer
No Review Yet
₹5,330
Binding:
Hardback
Release:
27 Mar 1973
Language:
English
Out of Stock
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14.
Characterization and Metrology for ULSI Technology 2000NR
Characterization and Metrology for ULSI Technology 2000
By: Patrick J. Smith, David G. Seiler, Alain C. Diebold, Thomas J. Shaffner, W. Murray Bullis
Publisher: American Institute of Physics
No Review Yet
₹16,609
Binding:
SA
Release:
01 Mar 2001
Language:
English
Out of Stock
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