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1.
Computer Algebra in Scientific Computing36 %
Computer Algebra in Scientific Computing
By: Vladimir P. Gerdt, Werner M. Seiler, Wolfram Koepf, Evgenii V. Vorozhtsov
Publisher: Springer International Publishing AG
No Review Yet
₹5,574
₹3,567
Binding:
Paperback
Release:
08 Sep 2015
Language:
English
Available
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2.
Frontiers of Characterization and Metrology for Nanoelectronics
Frontiers of Characterization and Metrology for Nanoelectronics
By: David G. Seiler, Alain C. Diebold, Erik M. Secula, Rajinder P. Khosla, Robert McDonald
Publisher: American Institute of Physics
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₹5,474
Binding:
Hardback
Release:
26 Oct 2009
Language:
English
Available
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3.
Computer Algebra in Scientific Computing37 %
Computer Algebra in Scientific Computing
By: Vladimir P. Gerdt, Werner M. Seiler, Wolfram Koepf, Evgenii V. Vorozhtsov
Publisher: Springer International Publishing AG
No Review Yet
₹7,247
₹4,566
Binding:
Paperback
Release:
24 Aug 2018
Language:
English
Available
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4.
Computer Algebra in Scientific Computing36 %
Computer Algebra in Scientific Computing
By: Vladimir P. Gerdt, Werner M. Seiler, Wolfram Koepf, Evgenii V. Vorozhtsov
Publisher: Springer International Publishing AG
No Review Yet
₹5,574
₹3,567
Binding:
Paperback
Release:
09 Sep 2016
Language:
English
Available
Ships within 14-16 Days Explain..
5.
Computer Algebra in Scientific Computing36 %
Computer Algebra in Scientific Computing
By: Vladimir P. Gerdt, Werner M. Seiler, Wolfram Koepf, Evgenii V. Vorozhtsov
Publisher: Springer International Publishing AG
No Review Yet
₹5,574
₹3,567
Binding:
Paperback
Release:
19 Aug 2014
Language:
English
Available
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6.
Computer Algebra in Scientific Computing37 %
Computer Algebra in Scientific Computing
By: Vladimir P. Gerdt, Werner M. Seiler, Wolfram Koepf, Evgenii V. Vorozhtsov
Publisher: Springer International Publishing AG
No Review Yet
₹7,804
₹4,917
Binding:
Paperback
Release:
31 Aug 2017
Language:
English
Available
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7.
Groundwater Recharge from Run-off, Infiltration and Percolation37 %
Groundwater Recharge from Run-off, Infiltration and Percolation
By: J.R. Gat, K.-P. Seiler
Publisher: Springer
No Review Yet
₹16,724
₹10,536
Binding:
Paperback
Release:
30 Nov 2010
Language:
English
Available
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8.
Groundwater Recharge from Run-off, Infiltration and Percolation37 %
Groundwater Recharge from Run-off, Infiltration and Percolation
By: J.R. Gat, K.-P. Seiler
Publisher: Springer-Verlag New York Inc.
No Review Yet
₹16,724
₹10,536
Binding:
Hardback
Release:
26 Sep 2007
Language:
English
Available
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9.
New Approaches Characterizing Groundwater Flow
New Approaches Characterizing Groundwater Flow
By: S. Wohnlich, K.-P. Seiler
Publisher: Taylor & Francis Ltd
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₹13,246
Binding:
Hardback
Release:
01 Jan 2001
Language:
English
Available
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10.
Groundwater Recharge from Run-Off, Infiltration and Percolation
Groundwater Recharge from Run-Off, Infiltration and Percolation
By: K -P Seiler, J R Gat
Publisher: Springer
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₹13,609
Binding:
Graphic Novel
Release:
01 Jan 2007
Out of Stock
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11.
Reel Time
Reel Time
By: Robert M Seiler, R M Seiler, Tamara P Seiler
Publisher: Au Press
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₹3,901
Binding:
Digital (delivered electronically)
Release:
01 Jan 2013
Language:
English
Out of Stock
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12.
Reel Time
Reel Time
By: Robert M Seiler, R M Seiler, Tamara P Seiler
Publisher: Au Press
No Review Yet
₹3,901
Binding:
Digital (delivered electronically)
Release:
30 Jun 2014
Language:
English
Out of Stock
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13.
Characterization and Metrology for Ulsi Technology 200533 %
Characterization and Metrology for Ulsi Technology 2005
By: David G. Seiler, Alain C. Diebold, Stefan Zollner, Erik M. Secula, Rajinder P. Khosla
Publisher: American Institute of Physics
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₹26,347
₹17,652
Binding:
Hardback
Release:
01 Sep 2005
Language:
English
Out of Stock
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14.
Frontiers of Characterization and Metrology for Nanoelectronics
Frontiers of Characterization and Metrology for Nanoelectronics
By: David G. Seiler, Alain C. Diebold, Erik M. Secula, Rajinder P. Khosla, Robert McDonald
Publisher: American Institute of Physics
No Review Yet
₹13,526
Binding:
SA
Release:
01 Sep 2007
Language:
English
Out of Stock
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15.
Characterization and Metrology for ULSI Technology 2003
Characterization and Metrology for ULSI Technology 2003
By: David G. Seiler, Alain C. Diebold, Thomas J. Shaffner, Stefan Zollner, Rajinder P. Khosla
Publisher: American Institute of Physics
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₹13,953
Binding:
Hardback
Release:
08 Oct 2003
Language:
English
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16.
Reel TimeNR
Reel Time
By: Robert M. Seiler, Tamara P. Seiler
Publisher: Au Press
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₹3,022
Binding:
Paperback
Release:
01 Dec 2012
Language:
English
Out of Stock
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17.
Computer Algebra in Scientific ComputingNR
Computer Algebra in Scientific Computing
By: Gerdt Vladimir P. Gerdt, Koepf Wolfram Koepf, Seiler Werner M. Seiler
Publisher: Springer Nature B.V.
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₹4,323
Binding:
Paperback
Release:
15 Sep 2016
Language:
English
Out of Stock
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18.
Computer Algebra in Scientific ComputingNR
Computer Algebra in Scientific Computing
By: Gerdt Vladimir P. Gerdt, Koepf Wolfram Koepf, Seiler Werner M. Seiler
Publisher: Springer Nature B.V.
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₹4,323
Binding:
Paperback
Release:
04 Sep 2017
Language:
English
Out of Stock
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19.
Computer Algebra in Scientific ComputingNR
Computer Algebra in Scientific Computing
By: Gerdt Vladimir P. Gerdt, Koepf Wolfram Koepf, Seiler Werner M. Seiler
Publisher: Springer Nature B.V.
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₹4,323
Binding:
Paperback
Release:
27 Aug 2018
Language:
English
Out of Stock
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20.
Computer Algebra in Scientific ComputingNR
Computer Algebra in Scientific Computing
By: Gerdt Vladimir P. Gerdt, Koepf Wolfram Koepf, Seiler Werner M. Seiler
Publisher: Springer Nature B.V.
No Review Yet
₹4,323
Binding:
Paperback
Release:
08 Oct 2014
Language:
English
Out of Stock
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